Pal, Subhadeep
68  Ergebnisse:
Personensuche X
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7

Biometrics-Signature Verification Techniques:

James, Sharon ; Pal, Subhadeep
IETE Journal of Education.  41 (2000)  3-4 - p. 63-66 , 2000
 
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12

Signal Energy based Probabilistic Inspection of Defect in C..:

, In: 2024 IEEE Applied Sensing Conference (APSCON),
 
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14

Data-Driven Approach for Identification of Damage in Compos..:

, In: Advances in Non-Destructive Evaluation; Lecture Notes in Mechanical Engineering,
 
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