Pan, Tongyang
38  Ergebnisse:
Personensuche X
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1

A meta-weighted network equipped with uncertainty estimatio..:

Pan, Tongyang ; Chen, Jinglong ; Liu, Zijun
Expert Systems with Applications.  252 (2024)  - p. 124161 , 2024
 
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2

Contrastive feature-based learning-guided elevated deep rei..:

He, Shuilong ; Cui, Qianwen ; Chen, Jinglong..
Mechanical Systems and Signal Processing.  211 (2024)  - p. 111192 , 2024
 
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3

Generative artificial intelligence and data augmentation fo..:

Liu, Shen ; Chen, Jinglong ; Feng, Yong...
Expert Systems with Applications.  255 (2024)  - p. 124511 , 2024
 
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4

End-to-end Temporal Transformer with Autocorrelated Attenti..:

Chen, Zhuohang ; Chen, Jinglong ; Pan, Tongyang.
Journal of Physics: Conference Series.  2762 (2024)  1 - p. 012048 , 2024
 
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7

Integrating Misidentification and OOD Detection for Reliabl..:

Feng, Yong ; Chen, Jinglong ; Xie, Zongliang...
IEEE Transactions on Intelligent Transportation Systems.  , 2024
 
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8

A variational transformer for predicting turbopump bearing ..:

Liu, Yulang ; Chen, Jinglong ; Wang, Tiantian..
Reliability Engineering & System Safety.  232 (2023)  - p. 109074 , 2023
 
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9

A meta network pruning framework for remaining useful life ..:

Pan, Tongyang ; Zhang, Sui ; Li, Fudong..
Mechanical Systems and Signal Processing.  195 (2023)  - p. 110271 , 2023
 
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10

Globally Localized Multisource Domain Adaptation for Cross-..:

Feng, Yong ; Chen, Jinglong ; He, Shuilong..
IEEE Transactions on Neural Networks and Learning Systems.  34 (2023)  6 - p. 3082-3096 , 2023
 
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11

A multi-head attention network with adaptive meta-transfer ..:

Pan, Tongyang ; Chen, Jinglong ; Ye, Zhisheng.
Reliability Engineering & System Safety.  225 (2022)  - p. 108610 , 2022
 
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12

Toward Small Sample Challenge in Intelligent Fault Diagnosi..:

Zhang, Tianci ; He, Shuilong ; Chen, Jinglong..
IEEE Transactions on Instrumentation and Measurement.  71 (2022)  - p. 1-13 , 2022
 
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15

Similarity Metric-Based Metalearning Network Combining Prio..:

Chang, Yuanhong ; Chen, Jinglong ; He, Shuilong.
IEEE Transactions on Instrumentation and Measurement.  71 (2022)  - p. 1-14 , 2022
 
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