Parize, Julien
13  Ergebnisse:
Personensuche X
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3

Neutron Displacement Damage Cross Section in GaN: Numerical..:

Lambert, Damien ; Parize, Julien ; Richard, Nicolas...
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1870-1877 , 2023
 
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4

Neutron displacement damage cross-section in GaN: numerical..:

Lambert, Damien ; Parize, Julien ; Richard, Nicolas...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3265463.  , 2023
 
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5

Neutron displacement damage cross-section in GaN: numerical..:

Lambert, Damien ; Parize, Julien ; Richard, Nicolas...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3265463.  , 2023
 
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6

Neutron displacement damage cross-section in GaN: numerical..:

Lambert, Damien ; Parize, Julien ; Richard, Nicolas...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3265463.  , 2023
 
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7

Neutron displacement damage cross-section in GaN: numerical..:

Lambert, Damien ; Parize, Julien ; Richard, Nicolas...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3265463.  , 2023
 
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8

Neutron displacement damage cross-section in GaN: numerical..:

Lambert, Damien ; Parize, Julien ; Richard, Nicolas...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2023.3265463.  , 2023
 
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11

Nanoscale Dopant Profiling of Individual Semiconductor Wire..:

Lassiaz, Timothée ; Tchoulfian, Pierre ; Donatini, Fabrice...
info:eu-repo/semantics/altIdentifier/doi/10.1021/acs.nanolett.0c04491.  , 2021
 
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12

Nanoscale Dopant Profiling of Individual Semiconductor Wire..:

Lassiaz, Timothée ; Tchoulfian, Pierre ; Donatini, Fabrice...
info:eu-repo/semantics/altIdentifier/doi/10.1021/acs.nanolett.0c04491.  , 2021
 
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13

Nanoscale Dopant Profiling of Individual Semiconductor Wire..:

Timothée Lassiaz (10534551) ; Pierre Tchoulfian (10534554) ; Fabrice Donatini (1511512)...
https://figshare.com/articles/journal_contribution/Nanoscale_Dopant_Profiling_of_Individual_Semiconductor_Wires_by_Capacitance_Voltage_Measurement/14381355.  , 2021
 
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