Stanley, M ; Parker‐Jervis, R ; de Graaf, S... https://eprints.whiterose.ac.uk/188168/6/Electronics%20Letters%20-%202022%20-%20Stanley%20-%20Validating%20S%E2%80%90parameter%20measurements%20of%20RF%20integrated%20circuits%20at%20milli%E2%80%90Kelvin%20%281%29.pdf.
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2022