Patil, Hemant
417  Ergebnisse:
Personensuche X
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2

Vulnerability issues in Automatic Speaker Verification (ASV..:

Gupta, Priyanka ; Patil, Hemant A. ; Guido, Rodrigo Capobianco
EURASIP Journal on Audio, Speech, and Music Processing.  2024 (2024)  1 - p. , 2024
 
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3

CQT-Based Cepstral Features for Classification of Normal vs..:

Patil, Hemant A. ; Kachhi, Aastha ; Patil, Ankur T.
IEEE/ACM Transactions on Audio, Speech, and Language Processing.  , 2024
 
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5

Modeling musical expectancy via reinforcement learning and ..:

Phatnani, Kirtana Sunil ; Patil, Hemant A.
Multimedia Tools and Applications.  83 (2023)  10 - p. 28523-28547 , 2023
 
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6

Quantifying the Emotional Landscape of Music with Three Dim..:

, In: Speech and Computer; Lecture Notes in Computer Science,
 
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7

Noise Robust Whisper Features for Dysarthric Severity-Level..:

, In: Lecture Notes in Computer Science; Pattern Recognition and Machine Intelligence,
 
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8

Linear Frequency Residual Cepstral Coefficients for Speech ..:

, In: Speech and Computer; Lecture Notes in Computer Science,
 
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9

A comparative evaluation of microleakage in three different..:

Avhad, Rajendra ; Avhad, Ranjukta ; Patil, Hemant
IP Annals of Prosthodontics and Restorative Dentistry.  9 (2023)  3 - p. 165-169 , 2023
 
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10

Cochlear Filter-Based Cepstral Features for Dysarthric Seve..:

, In: 2023 31st European Signal Processing Conference (EUSIPCO),
Rathod, Siddharth ; Gupta, Priyanka ; Kachhi, Aastha. - p. 1095-1099 , 2023
 
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12

Analysis of Mandarin vs English Language for Emotional Voic..:

, In: Speech and Computer; Lecture Notes in Computer Science,
Uthiraa, S. ; Patil, Hemant A. - p. 295-306 , 2023
 
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13

Exploring Residual Cepstral Features for Spoken Language Id..:

, In: 2023 Asia Pacific Signal and Information Processing Association Annual Summit and Conference (APSIPA ASC),
 
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14

Attentions for Short Duration Speech Classification:

, In: 2023 31st European Signal Processing Conference (EUSIPCO),
Modi, Hastin ; Patel, Maitreya ; Patil, Hemant A. - p. 1340-1344 , 2023
 
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15

Fruit Defect Inspection System Using Image Processing and I..:

, In: 2023 International Conference on Emerging Smart Computing and Informatics (ESCI),
 
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