Personensuche
X
?
2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE) ,
3
Electrical characterization and modeling of FDSOI MOSFETs f..:
, In:
?
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ,
6
Integrated Variability Measurements of 28 nm FDSOI MOSFETs ..:
, In:
?
2019 34th Symposium on Microelectronics Technology and Devices (SBMicro) ,
8