E-LIB Suche - Ergebnisse für: Paz de Araujo, C. A.

1

Effects of scaling the film thickness on the ferroelectric ..:

Celinska, J. ; Joshi, V. ; Narayan, S...
Applied Physics Letters. 82 (2003) 22 - p. 3937-3939 , 2003

Link: https://doi.org/10.1063/..

2

Mod preparation and characterization of blt thin film:

Tanaka, K. ; Uchiyama, K. ; Azuma, M....
Integrated Ferroelectrics. 36 (2001) 1-4 - p. 183-190 , 2001

Link: https://doi.org/10.1080/..

3

Low temperature process for strontium bismuth tantalate thi..:

Celinska, J. ; Joshi, V. ; Narayan, S...
Integrated Ferroelectrics. 30 (2000) 1-4 - p. 1-8 , 2000

Link: https://doi.org/10.1080/..

4

Low temperature crystallization of SrBi2Ta2O9 (SBT) films:

Uchiyama, K. ; Arita, K. ; Shimada, Y....
Integrated Ferroelectrics. 30 (2000) 1-4 - p. 103-110 , 2000

Link: https://doi.org/10.1080/..

5

SBT-based ferroelectric FET for nonvolatile non-destructive..:

Lim, M. ; Bacon, J. W. ; McMillan, L. D..
Integrated Ferroelectrics. 27 (1999) 1-4 - p. 71-80 , 1999

Link: https://doi.org/10.1080/..

6

Electrical properties of Y1-based ferroelectric gate MOS ca..:

Arita, K. ; Otsuki, T. ; Chen, Z....
Integrated Ferroelectrics. 27 (1999) 1-4 - p. 19-29 , 1999

Link: https://doi.org/10.1080/..

7

Chemical solution deposition (CSD) and characterization of ..:

Solayappan, N. ; Joshi, V. ; DeVilbiss, A....
Integrated Ferroelectrics. 22 (1998) 1-4 - p. 1-11 , 1998

Link: https://doi.org/10.1080/..

8

Characterization of ferroelectric gate Mos capacitors forme..:

Arita, K. ; Hayashi, S. ; Otsuki, T....
Integrated Ferroelectrics. 22 (1998) 1-4 - p. 143-152 , 1998

Link: https://doi.org/10.1080/..

9

Characterization of self-patterned SrBi2Ta2O9 thin films fr..:

Uchida, H. ; Soyama, N. ; Kageyama, K....
Integrated Ferroelectrics. 16 (1997) 1-4 - p. 41-52 , 1997

Link: https://doi.org/10.1080/..

10

Space charge capacitance of ferroelectric memory cells in t..:

Carrico, A. S. ; Paz De Araujo, C. A. ; Mihara, T..
Integrated Ferroelectrics. 13 (1996) 4 - p. 247-256 , 1996

Link: https://doi.org/10.1080/..

11

Integration technology of ferroelectrics and the performanc..:

Shimada, Y. ; Nagano, Y. ; Fujii, E....
Integrated Ferroelectrics. 11 (1995) 1-4 - p. 229-245 , 1995

Link: https://doi.org/10.1080/..

12

Characterization of an N-channel 1T-1C nonvolatile memory c..:

Melnick, B. M. ; Gregory, J. ; Paz De Araujo, C. A.
Integrated Ferroelectrics. 11 (1995) 1-4 - p. 145-160 , 1995

Link: https://doi.org/10.1080/..

13

Loss mechanisms in fine-grained ferroelectric ceramic thin ..:

Scott, J.F. ; Paz de Araujo, C.A. ; Melnick, B.M.
Journal of Alloys and Compounds. 211-212 (1994) - p. 451-454 , 1994

Link: https://doi.org/10.1016/..

14

Dielectric breakdown in high-ε films for ULSI DRAMs: II. ba..:

Scott, J. F. ; Azuma, M. ; Paz de Araujo, C. A....
Integrated Ferroelectrics. 4 (1994) 1 - p. 61-84 , 1994

Link: https://doi.org/10.1080/..

15

Deposition of Ba1−xSrxTiO3 and SrTiO3 via liquid source CVD..:

McMillan, L. D. ; Huffman, M. ; Roberts, T. L...
Integrated Ferroelectrics. 4 (1994) 4 - p. 319-324 , 1994

Link: https://doi.org/10.1080/..