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Pazos, Sebastian Matias
76  Ergebnisse:
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1

Minimization of the Line Resistance Impact on Memdiode-Base..:

Aguirre, Fernando Leonel ; Gomez, Nicolás M. ; Pazos, Sebastián Matías...
Journal of Low Power Electronics and Applications.  11 (2021)  1 - p. 9 , 2021
Link: https://doi.org/10.3390/..
 
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2

Decoupling the sequence of dielectric breakdown in single d..:

Aguirre, Fernando Leonel ; Ranjan, Alok ; Raghavan, Nagarajan...
Applied Physics Express.  14 (2021)  12 - p. 121001 , 2021
Link: https://doi.org/10.35848..
 
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3

Application of the Quasi-Static Memdiode Model in Cross-Poi..:

Aguirre, Fernando Leonel ; Pazos, Sebastian Matias ; Palumbo, Felix..
IEEE Access.  8 (2020)  - p. 202174-202193 , 2020
Link: https://doi.org/10.1109/..
 
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4

Hardware implementation of a true random number generator i..:

Pazos, Sebastian Matias ; Zheng, Wenwen ; Zanotti, Tommaso...
http://xlink.rsc.org/?DOI=D2NR06222D.  , 2023
Link: http://hdl.handle.net/10..
 
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5

Inkjet-printed h-BN memristors for hardware security:

Zhu, Kaichen ; Vescio, Giovanni ; González-Torres, Sergio...
http://xlink.rsc.org/?DOI=D3NR00030C.  , 2023
Link: http://hdl.handle.net/10..
 
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6

Minimization of the Line Resistance Impact on Memdiode-Base..:

Aguirre, Fernando Leonel ; Gomez, Nicolás M ; Pazos, Sebastián Matías...
Agencia Estatal de Investigación TEC2017-84321-C4-4-R.  , 2021
Link: https://ddd.uab.cat/reco..
 
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7

Standards for the Characterization of Endurance in Resistiv..:

Lanza, Mario ; Waser, Rainer ; Ielmini, Daniele...
https://pubs.acs.org/doi/10.1021/acsnano.1c06980.  , 2021
Link: http://hdl.handle.net/10..
 
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8

Decoupling the sequence of dielectric breakdown in single d..:

Aguirre, Fernando L ; Ranjan, Alok ; Raghavan, Nagarajan...
https://iopscience.iop.org/article/10.35848/1882-0786/ac345d.  , 2021
Link: http://hdl.handle.net/10..
 
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9

Study on the Connection Between the Set Transient in RRAMs ..:

Aguirre, Fernando Leonel ; Rodríguez Fernández, Alberto ; Pazos, Sebastián Matías...
European Commission 783176.  , 2019
Link: https://ddd.uab.cat/reco..
 
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10

Assessment and Improvement of the Pattern Recognition Perfo..:

Aguirre, Fernando Leonel ; Pazos, Sebastián Matías ; Palumbo, Félix Roberto Mario...
info:eu-repo/semantics/altIdentifier/url/https://www.mdpi.com/2079-9292/10/19/2427.  ,
Link: http://hdl.handle.net/11..
 
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11

Study on the Connection Between the Set Transient in RRAMs ..:

Aguirre, Fernando Leonel ; Rodriguez Fernandez, Alberto ; Pazos, Sebastián Matías...
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/8746809/.  ,
Link: http://hdl.handle.net/11..
 
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12

Minimization of the line resistance impact on memdiode-base..:

Aguirre, Fernando Leonel ; Gomez, Nicolás M ; Pazos, Sebastián Matías...
info:eu-repo/semantics/altIdentifier/url/https://www.mdpi.com/2079-9268/11/1/9.  ,
Link: http://hdl.handle.net/11..
 
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13

Comparative study of the breakdown transients of thin Al2O3..:

Pazos, Sebastián Matías ; Aguirre, Fernando Leonel ; Miranda, Enrique..
info:eu-repo/semantics/altIdentifier/url/https://aip.scitation.org/doi/abs/10.1063/1.4977851.  ,
Link: http://hdl.handle.net/11..
 
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14

Application of the quasi-static memdiode model in cross-poi..:

Aguirre, Fernando Leonel ; Pazos, Sebastián Matías ; Palumbo, Felix Roberto Mario..
info:eu-repo/semantics/altIdentifier/url/https://ieeexplore.ieee.org/document/9248999/.  ,
Link: http://hdl.handle.net/11..
 
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15

Effect of forming gas annealing on the degradation properti..:

Aguirre, Fernando Leonel ; Pazos, Sebastián Matías ; Palumbo, Félix Roberto Mario...
info:eu-repo/semantics/altIdentifier/url/http://aip.scitation.org/doi/10.1063/1.5018193.  ,
Link: http://hdl.handle.net/11..
 
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