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2023 35th International Conference on Microelectronic Test Structure (ICMTS) ,
8
Real-time electrical measurements during laser attack on ST..:
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2023 IEEE European Test Symposium (ETS) ,
10
On Using Cell-Aware Methodology for SRAM Bit Cell Testing:
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2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) ,
15