E-LIB Suche - Ergebnisse für: Petersen, Dirch H.

1

Temperature coefficient of resistance and thermal boundary ..:

Beltrán-Pitarch, Braulio ; Guralnik, Benny ; Borup, Kasper A...
Measurement Science and Technology. 35 (2024) 6 - p. 066012 , 2024

Link: https://doi.org/10.1088/..

2

Octahedral distortions in SrNbO3: Unraveling the structure-..:

Rosendal, Victor ; Brito, Walber H. ; Radovic, Milan...
Physical Review Materials. 7 (2023) 7 - p. , 2023

Link: https://doi.org/10.1103/..

3

Determination of thermal diffusivity of thermoelectric mate..:

Beltrán-Pitarch, Braulio ; Guralnik, Benny ; Lamba, Neetu...
Materials Today Physics. 31 (2023) - p. 100963 , 2023

Link: https://doi.org/10.1016/..

4

Determination of thermoelectric properties from micro four-..:

Guralnik, Benny ; Hansen, Ole ; Stilling-Andersen, Andreas R...
Measurement Science and Technology. 33 (2022) 12 - p. 125001 , 2022

Link: https://doi.org/10.1088/..

5

Review of Micro- and Nanoprobe Metrology for Direct Electri..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),

Guralnik, Benny ; Nielsen, Peter F. ; Petersen, Dirch H.... - p. 1-3 , 2022

Link: https://doi.org/10.1109/..

6

Determination of the temperature coefficient of resistance ..:

Marangoni, Thomas A. ; Guralnik, Benny ; Borup, Kasper A...
Journal of Applied Physics. 129 (2021) 16 - p. , 2021

Link: https://doi.org/10.1063/..

7

3ω correction method for eliminating resistance measurement..:

Guralnik, Benny ; Hansen, Ole ; Henrichsen, Henrik H....
Review of Scientific Instruments. 92 (2021) 9 - p. , 2021

Link: https://doi.org/10.1063/..

8

Effective electrical resistivity in a square array of orien..:

Guralnik, Benny ; Hansen, Ole ; Henrichsen, Henrik H...
Nanotechnology. 32 (2021) 18 - p. 185706 , 2021

Link: https://doi.org/10.1088/..

9

Wafer-scale graphene quality assessment using micro four-po..:

Mackenzie, David M A ; Kalhauge, Kristoffer G ; Whelan, Patrick R...
Nanotechnology. 31 (2020) 22 - p. 225709 , 2020

Link: https://doi.org/10.1088/..

10

Electrical Contact Formation in Micro Four‐Point Probe Meas..:

Folkersma, Steven ; Bogdanowicz, Janusz ; Petersen, Dirch H....
physica status solidi (a). 217 (2019) 5 - p. , 2019

Link: https://doi.org/10.1002/..

11

Qualitative analysis of scanning gate microscopy on epitaxi..:

Mackenzie, David M A ; Panchal, Vishal ; Corte-León, Héctor..
2D Materials. 6 (2019) 2 - p. 025023 , 2019

Link: https://doi.org/10.1088/..

12

A variable probe pitch micro-Hall effect method:

Witthøft, Maria-Louise ; Østerberg, Frederik W ; Bogdanowicz, Janusz...
Beilstein Journal of Nanotechnology. 9 (2018) - p. 2032-2039 , 2018

Link: https://doi.org/10.3762/..

13

Electrical Homogeneity Mapping of Epitaxial Graphene on Sil..:

Whelan, Patrick R. ; Panchal, Vishal ; Petersen, Dirch H....
ACS Applied Materials & Interfaces. 10 (2018) 37 - p. 31641-31647 , 2018

Link: https://doi.org/10.1021/..

14

Vibration tolerance of micro-electrodes:

Kalhauge, Kristoffer G ; Henrichsen, Henrik H ; Wang, Fei..
Journal of Micromechanics and Microengineering. 28 (2018) 9 - p. 095010 , 2018

Link: https://doi.org/10.1088/..

15

Electrical characterization of single nanometer-wide Si fin..:

Folkersma, Steven ; Bogdanowicz, Janusz ; Schulze, Andreas...
Beilstein Journal of Nanotechnology. 9 (2018) - p. 1863-1867 , 2018

Link: https://doi.org/10.3762/..