Petitdidier, S.
38  Ergebnisse:
Personensuche X
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3

Characterization and analysis of electrical trap related ef..:

Petitdidier, S. ; Berthet, F. ; Guhel, Y....
Microelectronics Reliability.  55 (2015)  9-10 - p. 1719-1723 , 2015
 
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6

Non uniformities of silicon oxide films grown in peroxide m..:

Bertagna, V. ; Petitdidier, S. ; Rochat, N....
Journal of Electroanalytical Chemistry.  584 (2005)  1 - p. 54-62 , 2005
 
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9

Thickness of surface thin oxide layers determined by impeda..:

Chemla, M ; Bertagna, V ; Erre, R...
Applied Surface Science.  227 (2004)  1-4 - p. 193-204 , 2004
 
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10

Infrared analysis of thin layers by attenuated total reflec..:

Rochat, N. ; Chabli, A. ; Bertin, F....
Materials Science and Engineering: B.  102 (2003)  1-3 - p. 16-21 , 2003
 
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12

Parasitic channel induced by an on-state stress in AlInN/Ga..:

Petitdidier, S ; Guhel, Y ; Trolet, J. L...
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4980114.  , 2017
 
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13

Parasitic channel induced by an on-state stress in AlInN/Ga..:

Petitdidier, S ; Guhel, Y ; Trolet, J. L...
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4980114.  , 2017
 
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14

Parasitic channel induced by an on-state stress in AlInN/Ga..:

Petitdidier, S ; Guhel, Y ; Trolet, J. L...
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4980114.  , 2017
 
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