Piao, Zhelong
8  Ergebnisse:
Personensuche X
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1

Random Flip Bit Aware Reading for Improving High-Density 3-..:

Feng, Hua ; Wei, Debao ; Gu, Shipeng...
IEEE Transactions on Circuits and Systems I: Regular Papers.  71 (2024)  5 - p. 2372-2383 , 2024
 
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2

Exploiting Feature Layer for Read Reference Voltage Optimiz..:

Wei, Debao ; Piao, Zhelong ; Liu, Ming...
IEEE Transactions on Consumer Electronics.  70 (2024)  1 - p. 433-444 , 2024
 
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3

Lightweight Read Reference Voltage Calibration Strategy for..:

Feng, Hua ; Wei, Debao ; Wang, Yongchao...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  3 - p. 370-379 , 2023
 
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4

Edge Word-Line Reliability Problem in 3-D NAND Flash Memory..:

Wei, Debao ; Feng, Hua ; Liu, Ming...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  6 - p. 861-873 , 2023
 
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5

FPGA-based reliability testing and analysis for 3D NAND fla..:

Wei, Debao ; Piao, Zhelong ; Feng, Hua..
Microelectronics Reliability.  114 (2020)  - p. 113846 , 2020
 
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6

Overexpression of Ubiquitin-Specific Protease15 (USP15) Pro..:

Yao, Xue-Qing ; Li, Ling ; Piao, Long-Zhen...
Technology in Cancer Research & Treatment.  19 (2020)  - p. 153303382096745 , 2020
 
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