Piotrowski, J.T.
687  Ergebnisse:
Personensuche X
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1

Oxidation Process of SiC by RTP Technique:

Kwietniewski, N. ; Gołaszewska, Krystyna ; Piotrowski, T.T....
Materials Science Forum.  615-617 (2009)  - p. 529-532 , 2009
 
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3

Properties of ZrN films as substrate masks in liquid phase ..:

Dobosz, D. ; Golaszewska, K. ; Zytkiewicz, Z. R....
Crystal Research and Technology.  40 (2005)  4-5 - p. 492-497 , 2005
 
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5

Application of tungsten films for substrate masking in liqu..:

Dobosz, D. ; Zytkiewicz, Z. R. ; Piotrowski, T.T....
Crystal Research and Technology.  38 (2003)  3-5 - p. 297-301 , 2003
 
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6

Ellipsometric investigations of (1 0 0) GaSb surface under ..:

Papis, E ; Kudła, A ; Piotrowski, T.T...
Materials Science in Semiconductor Processing.  4 (2001)  1-3 - p. 293-295 , 2001
 
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7

Electron beam lithography and reactive ion etching of nanom..:

Piotrowski, T.T. ; Piotrowska, A. ; Kamińska, E....
Materials Science and Engineering: C.  15 (2001)  1-2 - p. 171-173 , 2001
 
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10

Growth of Hg1-xMnxTe crystals by the travelling heater meth..:

Gille, P ; Rossner, U ; Puhlmann, N..
Semiconductor Science and Technology.  10 (1995)  3 - p. 353-357 , 1995
 
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12

Overview of recent advancements in IFMIF-DONES neutronics a..:

Qiu, Y. ; Ansorge, M. ; Álvarez, I....
Fusion Engineering and Design.  201 (2024)  - p. 114242 , 2024
 
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