E-LIB Suche - Ergebnisse für: Pluska, Mariusz

1

Coupled-cavity AlInAs/InGaAs/InP quantum cascade lasers fab..:

Pierściński, Kamil ; Bugajski, Maciej ; Czyszanowski, Tomasz...
Journal of Physics: Photonics. 1 (2018) 1 - p. 015001 , 2018

Link: https://doi.org/10.1088/..

2

Detrimental nonlocality in luminescence measurements:

Pluska, Mariusz ; Czerwinski, Andrzej
Journal of Applied Physics. 122 (2017) 6 - p. , 2017

Link: https://doi.org/10.1063/..

3

A study of different metals employed in metal–metal wavegui..:

Szymański, Michał ; Szerling, Anna ; Kosiel, Kamil.
Journal of Physics D: Applied Physics. 49 (2016) 27 - p. 275102 , 2016

Link: https://doi.org/10.1088/..

4

Optical examination of high contrast grating fabricated by ..:

Urbańczyk, Dominika ; Wójcik-Jedlińska, Anna ; Muszalski, Jan...
Optical and Quantum Electronics. 48 (2016) 4 - p. , 2016

Link: https://doi.org/10.1007/..

5

Formation of coupled-cavities in quantum cascade lasers usi..:

Czerwinski, Andrzej ; Pluska, Mariusz ; Łaszcz, Adam...
Microelectronics Reliability. 55 (2015) 9-10 - p. 2142-2146 , 2015

Link: https://doi.org/10.1016/..

6

Determining the Causes of Scanning Distortions in SEM and F..:

Pluska, Mariusz ; Czerwinski, Andrzej ; Wzorek, Marek..
Microscopy and Microanalysis. 21 (2015) S3 - p. 1703-1704 , 2015

Link: https://doi.org/10.1017/..

7

Changes in TCR of amorphous Ni–P resistive films as a funct..:

Kowalik, P. ; Pruszowski, Z. ; Kulawik, J....
Microelectronics International. 31 (2014) 3 - p. 149-153 , 2014

Link: https://doi.org/10.1108/..

8

Piezoresistive cantilever working in a shear force mode for..:

Sierakowski, Andrzej ; Kopiec, Daniel ; Janus, Paweł...
Measurement Science and Technology. 25 (2014) 4 - p. 044018 , 2014

Link: https://doi.org/10.1088/..

9

A method for the tin pest presence testing in SnCu solder a..:

Witek, Krzysztof ; Pluska, Mariusz ; Czerwinski, Andrzej..
Soldering & Surface Mount Technology. 26 (2014) 3 - p. 110-116 , 2014

Link: https://doi.org/10.1108/..

10

Influence of laminate type on tin whisker growth in tin-ric..:

Skwarek, Agata ; Pluska, Mariusz ; Czerwinski, Andrzej.
Materials Science and Engineering: B. 177 (2012) 15 - p. 1286-1291 , 2012

Link: https://doi.org/10.1016/..

11

Defect detection in semiconductor layers with built-in elec..:

Pluska, Mariusz ; Czerwinski, Andrzej ; Ratajczak, Jacek..
Physica B: Condensed Matter. 407 (2012) 15 - p. 2854-2857 , 2012

Link: https://doi.org/10.1016/..

12

Analysis of tin whisker growth on lead-free alloys with Ni ..:

Skwarek, Agata ; Pluska, Mariusz ; Ratajczak, Jacek...
Materials Science and Engineering: B. 176 (2011) 4 - p. 352-357 , 2011

Link: https://doi.org/10.1016/..

13

Occurrence of tin pest on the surface of tin‐rich lead‐free..:

Skwarek, Agata ; Sroda, Marcin ; Pluska, Mariusz...
Soldering & Surface Mount Technology. 23 (2011) 3 - p. 184-190 , 2011

Link: https://doi.org/10.1108/..

14

Separation of image-distortion sources and magnetic-field m..:

Płuska, Mariusz ; Czerwinski, Andrzej ; Ratajczak, Jacek...
Micron. 40 (2009) 1 - p. 46-50 , 2009

Link: https://doi.org/10.1016/..

15

Investigation of oval defects in (In)Ga(Al)As/GaAs heterost..:

Szerling, Anna ; Kosiel, Kamil ; Wójcik-Jedlińska, Anna..
Materials Science in Semiconductor Processing. 9 (2006) 1-3 - p. 25-30 , 2006

Link: https://doi.org/10.1016/..