E-LIB Suche - Ergebnisse für: Polgar, O

1

Comparative measurements on atomic layer deposited Al2O3 th..:

Petrik, P. ; Gumprecht, T. ; Nutsch, A....
Thin Solid Films. 541 (2013) - p. 131-135 , 2013

Link: https://doi.org/10.1016/..

2

Expanded beam (macro-imaging) ellipsometry:

Fried, M. ; Juhász, G. ; Major, C....
Thin Solid Films. 519 (2011) 9 - p. 2730-2736 , 2011

Link: https://doi.org/10.1016/..

3

Characterization of damage structure in ion implanted SiC u..:

Petrik, P. ; Zolnai, Z. ; Polgar, O....
Thin Solid Films. 519 (2011) 9 - p. 2791-2794 , 2011

Link: https://doi.org/10.1016/..

4

Application of wide angle beam spectroscopic ellipsometry f..:

Major, C. ; Juhász, G. ; Petrik, P....
Vacuum. 84 (2009) 1 - p. 119-122 , 2009

Link: https://doi.org/10.1016/..

5

Ellipsometric characterization of nanocrystals in porous si..:

Petrik, P. ; Fried, M. ; Vázsonyi, É....
Applied Surface Science. 253 (2006) 1 - p. 200-203 , 2006

Link: https://doi.org/10.1016/..

6

Dielectric function of disorder in high-fluence helium-impl..:

Petrik, P. ; Fried, M. ; Lohner, T....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 253 (2006) 1-2 - p. 192-195 , 2006

Link: https://doi.org/10.1016/..

7

Evaluation strategies for multi-layer, multi-material ellip..:

Polgár, O. ; Petrik, P. ; Lohner, T..
Applied Surface Science. 253 (2006) 1 - p. 57-64 , 2006

Link: https://doi.org/10.1016/..

8

Optical models for cavity profiles in high-dose helium-impl..:

Petrik, P. ; Fried, M. ; Lohner, T....
Journal of Applied Physics. 97 (2005) 12 - p. , 2005

Link: https://doi.org/10.1063/..

9

Depth distribution of disorder and cavities in high dose he..:

Petrik, P. ; Cayrel, F. ; Fried, M....
Thin Solid Films. 455-456 (2004) - p. 344-348 , 2004

Link: https://doi.org/10.1016/..

10

Evaluation of ellipsometric measurements using complex stra..:

Polgár, O. ; Fried, M. ; Lohner, T..
Thin Solid Films. 455-456 (2004) - p. 95-100 , 2004

Link: https://doi.org/10.1016/..

11

Ion implantation-caused damage in SiC measured by spectrosc..:

Petrik, P. ; Shaaban, E.R. ; Lohner, T....
Thin Solid Films. 455-456 (2004) - p. 239-243 , 2004

Link: https://doi.org/10.1016/..

12

Dose-dependence of ion implantation-caused damage in silico..:

Fried, M. ; Petrik, P. ; Lohner, T....
Thin Solid Films. 455-456 (2004) - p. 404-409 , 2004

Link: https://doi.org/10.1016/..

13

Ellipsometric characterization of damage profiles using an ..:

Petrik, P. ; Polgár, O. ; Fried, M....
Journal of Applied Physics. 93 (2003) 4 - p. 1987-1990 , 2003

Link: https://doi.org/10.1063/..

14

Ellipsometric characterization of oxidized porous silicon l..:

Lohner, T ; Fried, M ; Petrik, P...
Materials Science and Engineering: B. 69-70 (2000) - p. 182-187 , 2000

Link: https://doi.org/10.1016/..

15

Comparison of algorithms used for evaluation of ellipsometr..:

Polgár, O. ; Fried, M. ; Lohner, T..
Surface Science. 457 (2000) 1-2 - p. 157-177 , 2000

Link: https://doi.org/10.1016/..