E-LIB Suche - Ergebnisse für: Pollakowski, Beatrix

1

Traceable Quantitative Raman Microscopy and X-ray Fluoresce..:

Zakel, Sabine ; Pollakowski, Beatrix ; Streeck, Cornelia...
Applied Spectroscopy. 70 (2016) 2 - p. 279-288 , 2016

Link: https://doi.org/10.1177/..

2

Nondestructive Speciation Depth Profiling of Complex TiOx N..:

Pollakowski, Beatrix ; Beckhoff, Burkhard
Analytical Chemistry. 87 (2015) 15 - p. 7705-7711 , 2015

Link: https://doi.org/10.1021/..

3

Grazing incidence X-ray fluorescence analysis of buried int..:

Eisenhauer, David ; Pollakowski, Beatrix ; Baumann, Jonas...
physica status solidi (a). 212 (2015) 3 - p. 529-534 , 2015

Link: https://doi.org/10.1002/..

4

Chemical speciation at buried interfaces in high-temperatur..:

Becker, Christiane ; Pagels, Marcel ; Zachäus, Carolin...
Journal of Applied Physics. 113 (2013) 4 - p. , 2013

Link: https://doi.org/10.1063/..

5

Chemical bonds and elemental compositions of BCxNy layers p..:

Hoffmann, Peter S. ; Baake, Olaf ; Kosinova, Marina L....
X-Ray Spectrometry. 41 (2012) 4 - p. 240-246 , 2012

Link: https://doi.org/10.1002/..

6

Nondestructive and Nonpreparative Chemical Nanometrology of..:

Pollakowski, Beatrix ; Hoffmann, Peter ; Kosinova, Marina...
Analytical Chemistry. 85 (2012) 1 - p. 193-200 , 2012

Link: https://doi.org/10.1021/..

7

Entwicklung und Validierung der Methode GIXRF-NEXAFS zur An..:

Pollakowski, Beatrix , 2011

Link: http://nbn-resolving.de/..

8

Complementary Characterization of Buried Nanolayers by Quan..:

Unterumsberger, Rainer ; Pollakowski, Beatrix ; Müller, Matthias.
Analytical Chemistry. 83 (2011) 22 - p. 8623-8628 , 2011

Link: https://doi.org/10.1021/..

9

Combined ellipsometry and X-ray related techniques for stud..:

Krämer, Markus ; Roodenko, Katy ; Pollakowski, Beatrix...
Thin Solid Films. 518 (2010) 19 - p. 5509-5514 , 2010

Link: https://doi.org/10.1016/..

10

Analytical characterization of BCxNy films generated by LPC..:

Baake, Olaf ; Hoffmann, Peter S. ; Kosinova, Marina L....
Analytical and Bioanalytical Chemistry. 398 (2010) 2 - p. 1077-1084 , 2010

Link: https://doi.org/10.1007/..

11

Speciation of BC x N y films grown by PECVD with trimethylb..:

Baake, Olaf ; Hoffmann, Peter S. ; Klein, Andreas...
Analytical and Bioanalytical Chemistry. 395 (2009) 6 - p. 1901-1909 , 2009

Link: https://doi.org/10.1007/..

12

Nondestructive characterization of nanoscale layered sample:

Baake, Olaf ; Hoffmann, Peter S. ; Flege, Stefan...
Analytical and Bioanalytical Chemistry. 393 (2008) 2 - p. 623-634 , 2008

Link: https://doi.org/10.1007/..

13

Speciation of deeply buriedTiOxnanolayers with grazing-inci..:

Pollakowski, Beatrix ; Beckhoff, Burkhard ; Reinhardt, Falk..
Physical Review B. 77 (2008) 23 - p. , 2008

Link: https://doi.org/10.1103/..

14

Wafer Contamination Analysis, Speciation and Reference-free..:

Beckhoff, Burkhard ; Fliegauf, Rolf ; Kolbe, Michael...
ECS Transactions. 10 (2007) 1 - p. 51-56 , 2007

Link: https://doi.org/10.1149/..

15

Advanced Metrologies for Wafer Contamination and Nanolayer ..:

Beckhoff, Burkhard ; Fliegauf, Rolf ; Hönicke, Philipp...
ECS Transactions. 11 (2007) 3 - p. 273-279 , 2007

Link: https://doi.org/10.1149/..