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X
Pravossoudovitch, S.
27  Ergebnisse:
Personensuche X
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1

New March Elements for Address Decoder Open and Resistive O..:

Dilillo, L. ; Girard, P. ; Pravossoudovitch, S....
Journal of Integrated Circuits and Systems.  3 (2020)  1 - p. 7-12 , 2020
Link: https://doi.org/10.29292..
 
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2

A Hybrid Fault-Tolerant Architecture for Highly Reliable Pr..:

Wali, I. ; Virazel, Arnaud ; Bosio, A....
Journal of Electronic Testing.  32 (2016)  2 - p. 147-161 , 2016
Link: https://doi.org/10.1007/..
 
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3

Evaluating a radiation monitor for mixed-field environments..:

Tsiligiannis, G ; Dilillo, L ; Bosio, A...
Journal of Instrumentation.  9 (2014)  5 - p. C05052-C05052 , 2014
Link: https://doi.org/10.1088/..
 
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4

An SRAM Based Monitor for Mixed-Field Radiation Environment:

Tsiligiannis, G. ; Dilillo, L. ; Bosio, A....
IEEE Transactions on Nuclear Science.  61 (2014)  4 - p. 1663-1670 , 2014
Link: https://doi.org/10.1109/..
 
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5

Analysis and Fault Modeling of Actual Resistive Defects in ..:

Mauroux, P.-D. ; Virazel, A. ; Bosio, A....
Journal of Electronic Testing.  28 (2012)  2 - p. 215-228 , 2012
Link: https://doi.org/10.1007/..
 
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6

A statistical simulation method for reliability analysis of..:

, In: Proceedings of the 47th Design Automation Conference,
Fonseca, R. A. ; Dilillo, L. ; Bosio, A.... - p. 853-856 , 2010
Link: https://dl.acm.org/doi/1..
 
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7

Analysis of Resistive-Open Defects in SRAM Sense Amplifiers:

Ney, A. ; Girard, P. ; Pravossoudovitch, S...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  17 (2009)  10 - p. 1556-1559 , 2009
Link: https://doi.org/10.1109/..
 
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8

A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection..:

Ginez, O. ; Daga, J.-M. ; Girard, P....
Journal of Electronic Testing.  25 (2009)  2-3 - p. 127-144 , 2009
Link: https://doi.org/10.1007/..
 
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9

A new design-for-test technique for SRAM core-cell stabilit..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Ney, A. ; Dilillo, L. ; Girard, P.... - p. 1344-1348 , 2009
Link: https://dl.acm.org/doi/1..
 
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10

A Selective Scan Slice Encoding Technique for Test Data Vol..:

Badereddine, N. ; Wang, Z. ; Girard, P....
Journal of Electronic Testing.  24 (2008)  4 - p. 353-364 , 2008
Link: https://doi.org/10.1007/..
 
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11

A design-for-diagnosis technique for SRAM write drivers:

, In: Proceedings of the conference on Design, automation and test in Europe,
Ney, A. ; Girard, P. ; Pravossoudovitch, S.... - p. 1480-1485 , 2008
Link: https://dl.acm.org/doi/1..
 
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12

Slow write driver faults in 65nm SRAM technology : analy..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Ney, A. ; Girard, P. ; Landrault, C.... - p. 528-533 , 2007
Link: https://dl.acm.org/doi/1..
 
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13

Resistive-open defect injection in SRAM core-cell : anal..:

, In: Proceedings of the 42nd annual Design Automation Conference,
Dilillo, L. ; Girard, P. ; Pravossoudovitch, S... - p. 857-862 , 2005
Link: https://dl.acm.org/doi/1..
 
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14

Resistive-open defect injection in SRAM core-cell: analysis..:

, In: Proceedings. 42nd Design Automation Conference, 2005.,
Dilillo, L. ; Girard, P. ; Pravossoudovitch, S... - p. 857,858,859,860,861,862 , 2005
Link: https://doi.org/10.1145/..
 
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15

Power-Driven Routing-Constrained Scan Chain Design:

Bonhomme, Y. ; Girard, P. ; Guiller, L...
Journal of Electronic Testing.  20 (2004)  6 - p. 647-660 , 2004
Link: https://doi.org/10.1007/..
 
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