Prume, K.
14  Ergebnisse:
Personensuche X
?
1

A simple and powerful analytical model for MEMS piezoelectr..:

Booij, W. E. ; Vogl, A. H. ; Wang, D. T....
Journal of Electroceramics.  19 (2007)  4 - p. 387-393 , 2007
 
?
2

Taking piezoelectric microsystems from the laboratory to pr..:

Ræder, H. ; Tyholdt, F. ; Booij, W....
Journal of Electroceramics.  19 (2007)  4 - p. 357-362 , 2007
 
?
3

Chemically derived seeding layer for {100}-textured PZT thi..:

Tyholdt, F. ; Calame, F. ; Prume, K...
Journal of Electroceramics.  19 (2007)  4 - p. 311-314 , 2007
 
?
5

In-situ compensation of the parasitic capacitance for nanos..:

Schmitz, T. ; Prume, K. ; Reichenberg, B....
Journal of the European Ceramic Society.  24 (2004)  6 - p. 1145-1147 , 2004
 
?
6

Effects of the top-electrode size on the piezoelectric prop..:

Gerber, P. ; Roelofs, A. ; Kügeler, C....
Journal of Applied Physics.  96 (2004)  5 - p. 2800-2804 , 2004
 
?
7

High Speed and High Resolution Measurements on Submicron Ca..:

Schmitz, T. ; Tiedke, S. ; Prume, K....
Integrated Ferroelectrics.  53 (2003)  1 - p. 371-378 , 2003
 
?
8

Electrical measurements on capacitor sizes in the submicron..:

Schmitz, T. ; Prume, K. ; Tiedke, S....
Integrated Ferroelectrics.  37 (2001)  1-4 - p. 163-172 , 2001
 
?
 
?
10

Direct hysteresis measurements of single nanosized ferroele..:

Tiedke, S. ; Schmitz, T. ; Prume, K....
Applied Physics Letters.  79 (2001)  22 - p. 3678-3680 , 2001
 
?
11

Analysis of shape effects on the piezoresponse in ferroelec..:

Peter, F ; Rüdiger, A ; Dittmann, R...
info:eu-repo/semantics/altIdentifier/issn/0003-6951.  , 2005
 
?
12

Dynamic leakage current compensation in ferroelectric thin-..:

Meyer, R ; Waser, R ; Prume, K..
info:eu-repo/semantics/altIdentifier/doi/10.1063/1.1897425.  , 2005
 
?
13

Effects of the top-electode size on the piezoelectric prope..:

Gerber, P ; Roelofs, A ; Kügeler, C...
info:eu-repo/semantics/altIdentifier/hdl/2128/1021.  , 2004
 
?
 
1-14