Pulskamp, Jeffrey S
113  Ergebnisse:
Personensuche X
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1

Quadruple Mass Gyroscope Angle Random Walk Reduction Throug..:

Knight, Ryan R. ; Rudy, Ryan Q. ; Pulskamp, Jeffrey S....
Journal of Microelectromechanical Systems.  33 (2024)  3 - p. 308-321 , 2024
 
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2

Atomic Layer Deposition and Sputtering of Piezoelectric Thi..:

, In: 2023 IEEE/ION Position, Location and Navigation Symposium (PLANS),
 
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3

Dynamic Quality Factor Equalization for Improved Bias Stabi..:

, In: 2023 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL),
 
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4

Large Amplitude Linear Drive Quadruple Mass Gyroscope:

, In: 2023 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL),
 
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5

Growth of thin film ferroelectric PZT, PHT, and antiferroel..:

Strnad, Nicholas A. ; Hanrahan, Brendan M. ; Potrepka, Daniel M....
Journal of the American Ceramic Society.  104 (2020)  3 - p. 1216-1228 , 2020
 
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6

Fundamental limits of disk flexure resonators:

, In: 2017 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS),
 
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7

Thin-film piezoelectric and high-aspect ratio polymer leg m..:

Choi, Jongsoo ; Shin, Minchul ; Rudy, Ryan Q....
International Journal of Intelligent Robotics and Applications.  1 (2017)  2 - p. 180-194 , 2017
 
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8

Nano- and micro-electromechanical switch dynamics:

Pulskamp, Jeffrey S ; Proie, Robert M ; Polcawich, Ronald G
Journal of Micromechanics and Microengineering.  24 (2013)  1 - p. 015011 , 2013
 
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9

PZT‐Based Piezoelectric MEMS Technology:

Smith, Gabriel L. ; Pulskamp, Jeffrey S. ; Sanchez, Luz M....
Journal of the American Ceramic Society.  95 (2012)  6 - p. 1777-1792 , 2012
 
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12

Modeling and Optimal Low-Power On–Off Control of Thin-Film ..:

Edamana, Biju ; Hahn, Bongsu ; Pulskamp, Jeffrey S...
IEEE/ASME Transactions on Mechatronics.  16 (2011)  5 - p. 884-896 , 2011
 
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13

Large displacement vertical translational actuator based on..:

Qiu, Zhen ; Pulskamp, Jeffrey S ; Lin, Xianke...
Journal of Micromechanics and Microengineering.  20 (2010)  7 - p. 075016 , 2010
 
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