Qiao, Liyan
372  Ergebnisse:
Personensuche X
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3

Self-assembly of chemical shakers:

Qiao, Liyan ; Kapral, Raymond
The Journal of Chemical Physics.  160 (2024)  15 - p. , 2024
 
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5

Exploiting Feature Layer for Read Reference Voltage Optimiz..:

Wei, Debao ; Piao, Zhelong ; Liu, Ming...
IEEE Transactions on Consumer Electronics.  70 (2024)  1 - p. 433-444 , 2024
 
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6

Random Flip Bit Aware Reading for Improving High-Density 3-..:

Feng, Hua ; Wei, Debao ; Gu, Shipeng...
IEEE Transactions on Circuits and Systems I: Regular Papers.  71 (2024)  5 - p. 2372-2383 , 2024
 
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8

EBDN: Entropy-Based Double Nonuniform Sensing Algorithm for..:

Wang, Yongchao ; Wei, Debao ; Liu, Ming..
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  43 (2024)  6 - p. 1914-1918 , 2024
 
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9

Sub-Nyquist Sampling and Measurement of FRI Signals With Ad..:

Yun, Shuangxing ; Xu, Hongwei ; Fu, Ning.
IEEE Transactions on Instrumentation and Measurement.  72 (2023)  - p. 1-11 , 2023
 
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10

Robust Time-Based Finite-Rate-of-Innovation Sampling Method..:

, In: 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
Fu, Ning ; Zhang, Hongyi ; Qiao, Liyan - p. 01-06 , 2023
 
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11

Robust Parameter Measurement of PSK Signals Based on FRI Sa..:

Wei, Zhiliang ; Fu, Ning ; Jiang, Siyi.
IEEE Transactions on Instrumentation and Measurement.  72 (2023)  - p. 1-12 , 2023
 
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12

Sub-Nyquist Measurement of LFM Pulse Stream Based on Signal..:

Fu, Ning ; Yun, Shuangxing ; Han, Bingtong.
IEEE Transactions on Instrumentation and Measurement.  72 (2023)  - p. 1-15 , 2023
 
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13

Edge Word-Line Reliability Problem in 3-D NAND Flash Memory..:

Wei, Debao ; Feng, Hua ; Liu, Ming...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  6 - p. 861-873 , 2023
 
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14

Neural Network Based Threshold Voltage Model for 3D TLC NAN..:

, In: 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI),
Wei, Debao ; Qu, Jingyuan ; Song, Yu.. - p. 125-132 , 2023
 
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15

Cascaded Compensation of Filter Phase Imperfections in Rand..:

, In: 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI),
Bian, Chenxi ; Zhang, Jingchao ; Li, Lin. - p. 360-365 , 2023
 
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