E-LIB Suche - Ergebnisse für: Rading, Derk

1

Leveraging ToF-SIMS imaging to investigate tenofovir disopr..:

Topolski, Josey E. ; Sheng, Huaming ; Moore, Colman...
Journal of Pharmaceutical and Biomedical Analysis. 239 (2024) - p. 115863 , 2024

Link: https://doi.org/10.1016/..

2

Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protoc..:

Smentkowski, Vincent ; Goswami, Shubhodeep ; Kollmer, Felix...
Microscopy and Microanalysis. 27 (2021) S1 - p. 1564-1565 , 2021

Link: https://doi.org/10.1017/..

3

Correction to Measuring Compositions in Organic Depth Profi..:

Shard, Alexander G. ; Havelund, Rasmus ; Spencer, Steve J....
The Journal of Physical Chemistry B. 119 (2015) 44 - p. 14337-14337 , 2015

Link: https://doi.org/10.1021/..

4

Measuring Compositions in Organic Depth Profiling: Results ..:

Shard, Alexander G. ; Havelund, Rasmus ; Spencer, Steve J....
The Journal of Physical Chemistry B. 119 (2015) 33 - p. 10784-10797 , 2015

Link: https://doi.org/10.1021/..

5

Time-of-Flight Secondary Ion Mass Spectroscopy with Bismuth..:

Trzyna, Malgorzata ; Berchenko, Nicolas ; Rading, Derk.
European Journal of Mass Spectrometry. 20 (2014) 6 - p. 429-436 , 2014

Link: https://doi.org/10.1255/..

6

Low-temperature plasma for compositional depth profiling of..:

Muramoto, Shin ; Rading, Derk ; Bush, Brian..
Rapid Communications in Mass Spectrometry. 28 (2014) 18 - p. 1971-1978 , 2014

Link: https://doi.org/10.1002/..

7

Dual beam depth profiling of organic materials: assessment ..:

Niehuis, Ewald ; Moellers, Rudolf ; Rading, Derk.
Surface and Interface Analysis. 46 (2014) S1 - p. 70-73 , 2014

Link: https://doi.org/10.1002/..

8

Argon Cluster Ion Beams for Organic Depth Profiling: Result..:

Shard, Alexander G. ; Havelund, Rasmus ; Seah, Martin P....
Analytical Chemistry. 84 (2012) 18 - p. 7865-7873 , 2012

Link: https://doi.org/10.1021/..

9

Application of TOF-SIMS for high precision ion implant dosi..:

Grehl, Thomas ; Möllers, Rudolf ; Niehuis, Ewald.
Applied Surface Science. 255 (2008) 4 - p. 1404-1407 , 2008

Link: https://doi.org/10.1016/..

10

Static SIMS investigation of immobilized molecules on polym..:

Leute, Angelika ; Rading, Derk ; Benninghoven, Alfred..
Advanced Materials. 6 (1994) 10 - p. 775-780 , 1994

Link: https://doi.org/10.1002/..

11

Comparative investigations of the secondary ion emission of..:

Feld, Herbert ; Rading, Derk ; Leute, Angelika.
Organic Mass Spectrometry. 28 (1993) 8 - p. 841-852 , 1993

Link: https://doi.org/10.1002/..

12

High Mass Resolution Plasma Desorption and Secondary Ion Ma..:

Feld, Herbert ; Leute, Angelika ; Rading, Derk...
Zeitschrift für Naturforschung B. 47 (1992) 7 - p. 929-936 , 1992

Link: https://doi.org/10.1515/..

13

Analysis of ionic metal complexes by time-of-flight seconda..:

Feld, Herbert ; Leute, Angelika ; Rading, Derk...
International Journal of Mass Spectrometry and Ion Processes. 110 (1991) 3 - p. 225-235 , 1991

Link: https://doi.org/10.1016/..

14

VAMAS TWA2 interlaboratory comparison: Surface analysis of ..:

Bennet, Francesca ; Opitz, Robert ; Ghoreishi, Narges...
boreal:278080. , 2023

Link: http://hdl.handle.net/20..

15

VAMAS TWA2 interlaboratory comparison: Surface analysis of ..:

Bennet, Francesca ; Opitz, Robert ; Ghoreishi, Narges...
boreal:278080. , 2023

Link: http://hdl.handle.net/20..