E-LIB Suche - Ergebnisse für: Rafhay, Q.

1

Variability of Trap-induced Mobility Fluctuations in Nanosc..:

, In: 2023 International Electron Devices Meeting (IEDM),

Gauthier, O. ; Haendler, S. ; Rafhay, Q.. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

2

Investigation of resistance fluctuations in ReRAM: physical..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Reganaz, L. ; Deleruyelle, D. ; Rafhay, Q.... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

3

Platinum redistribution in the Ni0.9Pt0.1/InP system: Impac..:

Boyer, F. ; Dabertrand, K. ; Gergaud, P....
Materials Science in Semiconductor Processing. 128 (2021) - p. 105731 , 2021

Link: https://doi.org/10.1016/..

4

Reliability of CMOS-Compatible Ti / n-InP and Ti / p-InGaAs..:

, In: 2019 IEEE 16th International Conference on Group IV Photonics (GFP),

Boyer, F. ; Jany, C. ; Da Fonseca, J.... - p. 1-2 , 2019

Link: https://doi.org/10.1109/..

5

New Y -function based MOSFET parameter extraction method fr..:

Henry, J.B. ; Rafhay, Q. ; Cros, A..
Solid-State Electronics. 123 (2016) - p. 84-88 , 2016

Link: https://doi.org/10.1016/..

6

Compact modeling of subthreshold swing in double gate and n..:

Hiblot, G. ; Rafhay, Q. ; Boeuf, F..
Solid-State Electronics. 111 (2015) - p. 188-195 , 2015

Link: https://doi.org/10.1016/..

7

Compact model of short-channel effects for FDSOI devices in..:

Hiblot, G. ; Lacord, J. ; Akbal, M....
Solid-State Electronics. 107 (2015) - p. 1-7 , 2015

Link: https://doi.org/10.1016/..

8

Compact modeling of the shift between classical and quantum..:

Hiblot, G. ; Rafhay, Q. ; Boeuf, F..
Solid-State Electronics. 100 (2014) - p. 71-78 , 2014

Link: https://doi.org/10.1016/..

9

Analytical relationship between subthreshold swing of therm..:

Hiblot, G. ; Rafhay, Q. ; Boeuf, F..
Electronics Letters. 50 (2014) 23 - p. 1745-1747 , 2014

Link: https://doi.org/10.1049/..

10

New parameter extraction method based on split C–V measurem..:

Ben Akkez, Imed ; Cros, Antoine ; Fenouillet-Beranger, Claire...
Solid-State Electronics. 84 (2013) - p. 142-146 , 2013

Link: https://doi.org/10.1016/..

11

Impact of quantum effects on the short channel effects of I..:

Dutta, T. ; Rafhay, Q. ; Clerc, R....
Solid-State Electronics. 88 (2013) - p. 43-48 , 2013

Link: https://doi.org/10.1016/..

12

Characterization and 3D TCAD simulation of NOR-type flash n..:

Zaka, A. ; Singer, J. ; Dornel, E....
Solid-State Electronics. 63 (2011) 1 - p. 158-162 , 2011

Link: https://doi.org/10.1016/..

13

Technological guidelines for the design of tandem III-V nan..:

Maryasin V ; BUCCI, DANIELE ; Rafhay Q...
info:eu-repo/semantics/altIdentifier/wos/WOS:000411540000038. , 2017

Link: http://hdl.handle.net/11..

14

New Y -function based MOSFET parameter extraction method fr..:

Henry, J.B ; Rafhay, Q ; Cros, A.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2016.06.004. , 2016

Link: https://hal.science/hal-..

15

Compact modeling of subthreshold swing in double gate and n..:

Hiblot, G ; Rafhay, Q ; Boeuf, F.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2015.06.008. , 2015

Link: https://hal.science/hal-..