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Rajski, J.
405  Ergebnisse:
Personensuche X
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1

Identification of non-intentionally added substances in foo..:

Martínez-Bueno, M.J. ; Hernando, M.D. ; Uclés, S....
Talanta.  172 (2017)  - p. 68-77 , 2017
Link: https://doi.org/10.1016/..
 
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2

Should We Be Concerned About Asymptomatic Adnexal Masses in..:

Mazanowska, N. ; Rajski, D. ; Pietrzak, B...
Transplantation Proceedings.  48 (2016)  5 - p. 1532-1534 , 2016
Link: https://doi.org/10.1016/..
 
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3

On Deploying Scan Chains for Data Storage in Test Compressi..:

Czysz, D. ; Mrugalski, G. ; Mukherjee, N...
IEEE Design & Test.  30 (2013)  1 - p. 68-76 , 2013
Link: https://doi.org/10.1109/..
 
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4

Test response compactor with programmable selector:

, In: 2006 43rd ACM/IEEE Design Automation Conference,
Mrugalski, G. ; Rajski, J. ; Tyszer, J. - p. 1089-1094 , 2006
Link: https://doi.org/10.1145/..
 
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5

High-frequency, at-speed scan testing:

Xijiiang Lin ; Press, R. ; Rajski, J....
IEEE Design & Test of Computers.  20 (2003)  5 - p. 17-25 , 2003
Link: https://doi.org/10.1109/..
 
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6

Test data compression:

McCluskey, E.J. ; Burek, D. ; Koenemann, B....
IEEE Design & Test of Computers.  20 (2003)  2 - p. 76-87 , 2003
Link: https://doi.org/10.1109/..
 
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7

Embedded deterministic test for low-cost manufacturing:

Rajski, J. ; Kassab, M. ; Mukherjee, N....
IEEE Design & Test of Computers.  20 (2003)  5 - p. 58-66 , 2003
Link: https://doi.org/10.1109/..
 
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8

2D test sequence generators:

Mrugalski, G. ; Tyszer, J. ; Rajski, J.
IEEE Design & Test of Computers.  20 (2003)  1 - p. 51-59 , 2003
Link: https://doi.org/10.1109/..
 
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9

Finding a Common Fault Response for Diagnosis during Silico..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Pomeranz, I. ; Rajski, J. ; Reddy, S. - p. 1116 ff. , 2002
Link: https://dl.acm.org/doi/1..
 
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10

Improving the proportion of at-speed tests in scan BIST:

, In: Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design,
Huang, Y. ; Pomeranz, I. ; Reddy, S. M.. - p. 459-463 , 2000
Link: https://dl.acm.org/doi/1..
 
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11

Testing of telecommunications hardware [Guest Editorial]:

Rajski, J. ; Tyszer, J.
IEEE Communications Magazine.  37 (1999)  6 - p. 60-62 , 1999
Link: https://doi.org/10.1109/..
 
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12

Arithmetic built-in self-test for DSP cores:

Radecka, K. ; Rajski, J. ; Tyszer, J.
Computer Standards & Interfaces.  20 (1999)  6-7 - p. 473 , 1999
Link: https://doi.org/10.1016/..
 
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13

STARBIST : scan autocorrelated random pattern generation:

, In: Proceedings of the 34th annual Design Automation Conference,
Tsai, K. H. ; Hellebrand, S. ; Rajski, J.. - p. 472-477 , 1997
Link: https://dl.acm.org/doi/1..
 
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14

Testability implications of performance driven logic synthe..:

Marchok, T.E. ; El-Maleh, A. ; Rajski, J..
IEEE Design & Test of Computers.  12 (1995)  2 - p. 32-39 , 1995
Link: https://doi.org/10.1109/..
 
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15

Software accelerated functional fault simulation for data-p..:

, In: Proceedings of the 32nd annual ACM/IEEE Design Automation Conference,
Kassab, M. ; Mukherjee, N. ; Rajski, J.. - p. 333-338 , 1995
Link: https://dl.acm.org/doi/1..
 
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