Ralph, Brian
4647  Ergebnisse:
Personensuche X
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1

SAR studies on truxillic acid mono esters as a new class of..:

Yan, Su ; Elmes, Matthew W. ; Tong, Simon...
European Journal of Medicinal Chemistry.  154 (2018)  - p. 233-252 , 2018
 
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2

Microstructural Evolution in Materials during Thermal Proce..:

Lai, Joseph K. L. ; Ralph, Brian ; Chen, Zhiwen.
Advances in Materials Science and Engineering.  2012 (2012)  - p. 1-2 , 2012
 
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3

The basics of crystallography and diffraction:

Ralph, Brian
Materials Characterization.  61 (2010)  1 - p. 134 , 2010
 
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4

Advances in ceramic materials 

special topic volume with invited papers only  Materials science forum ; 606
Exemplar:  Zentrale:E02 a ing 955 m/547
 
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7

Adhesive strength of flip chip packages:

Chiang, W.K. ; Chan, Y.C. ; Ralph, Brian.
International Journal of Adhesion and Adhesives.  28 (2008)  3 - p. 109-119 , 2008
 
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8

Dictionary of microscopy:

Ralph, Brian
Materials Characterization.  58 (2007)  10 - p. 1039 , 2007
 
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9

Processability and reliability of nonconductive adhesives (..:

Chiang, W. K. ; Chan, Y. C. ; Ralph, Brian.
Journal of Electronic Materials.  35 (2006)  3 - p. 443-452 , 2006
 
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10

Book reviews:

Ralph, Brian
Materials Characterization.  57 (2006)  4-5 - p. 430 , 2006
 
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11

Three-dimensional X-ray diffraction microscopy (mapping pol..:

Ralph, Brian
Materials Characterization.  54 (2005)  2 - p. 183 , 2005
 
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12

Self-Sensing Fibre Reinforced Composites:

Fernando, Gerard F ; Degamber, Balkarransingh ; Wang, Liwei...
Advanced Composites Letters.  13 (2004)  2 - p. 096369350401300 , 2004
 
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13

Applying organizational environmental tools and techniques:

Lawrence, Elaine ; Andrews, Duncan ; Ralph, Brian.
Corporate Social Responsibility and Environmental Management.  9 (2002)  2 - p. 116-125 , 2002
 
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14

STERMAT 2000:

Ralph, Brian ; Wojnar, Leszek ; Kurzydłowski, Krzysztof J..
Materials Characterization.  46 (2001)  2-3 - p. 85 , 2001
 
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15

Anisotropy of grain growth in polycrystals of α-Fe:

Janicki, Marcin ; Mizera, Jarosław ; Ralph, Brian..
Materials Science and Engineering: A.  298 (2001)  1-2 - p. 187-192 , 2001
 
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