Ramajo, L.A.
861  Ergebnisse:
Personensuche X
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2

Climate change-related risks and adaptation potential in Ce..:

Hagen, I ; Huggel, C ; Ramajo, L...
Environmental Research Letters.  17 (2022)  3 - p. 033002 , 2022
 
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3

Influence of the sintering temperature on ferroelectric pro..:

Cortés, J. A. ; Camargo, J. ; Rachia, M. F....
Journal of Advanced Dielectrics.  11 (2021)  3 - p. 2140002 , 2021
 
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4

UV-response of aluminum-doped zinc oxide transparent films ..:

Villegas, E.A. ; Ramajo, L.A. ; Lere, M.E...
Materials Science in Semiconductor Processing.  121 (2021)  - p. 105412 , 2021
 
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5

Influence of CuO addition on dielectric and piezoelectric p..:

Difeo, M. ; Ramajo, L. ; Castro, M.
Journal of Advanced Dielectrics.  11 (2021)  3 - p. 2140004 , 2021
 
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6

Influence of the BaTiO3 addition to K0.5Na0.5NbO3 lead-free..:

Espinosa, A. Prado ; Ramajo, L. ; Rubio-Marcos, F....
Journal of the European Ceramic Society.  41 (2021)  2 - p. 1288-1298 , 2021
 
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8

Synthesis and characterization of Bi0.5Na0.5TiO3-BaTiO3-K0...:

Prado, A. ; Camargo, J. ; Öchsner, P...
Journal of Electroceramics.  44 (2020)  3-4 - p. 248-255 , 2020
 
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10

Configuración y montaje de instrumento para la caracterizac..:

Camargo, J. ; Lere, M. ; Castro, M..
Revista Mexicana de Física.  66 (2020)  4 Jul-Aug - p. 462-474 , 2020
 
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11

Cellular mullite materials processed by direct foaming and ..:

Sandoval, M.L. ; Ramajo, L. ; Camerucci, M.A.
Journal of the European Ceramic Society.  39 (2019)  7 - p. 2472-2483 , 2019
 
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12

Stabilization of the morphotropic phase boundary in (1 − x)..:

Prado, A. ; Ramajo, L. ; Camargo, J....
Journal of Materials Science: Materials in Electronics.  30 (2019)  20 - p. 18405-18412 , 2019
 
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13

Influence of the sintering process on ferroelectric propert..:

Camargo, J. ; Prado Espinosa, A. ; Ramajo, L..
Journal of Materials Science: Materials in Electronics.  29 (2018)  7 - p. 5427-5432 , 2018
 
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15

Mechanical properties enhancement in potassium-sodium nioba..:

Ramajo, L. ; Castro, M. ; Fernandez, J. F..
Journal of Materials Science: Materials in Electronics.  28 (2016)  7 - p. 5128-5134 , 2016
 
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