Rao, Yunliang
23  Ergebnisse:
Personensuche X
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1

Investigation of Threshold Voltage Instability of SiC MOSFE..:

Chen, Yuan ; Rao, Yunliang ; Wang, Mei...
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2536-2542 , 2024
 
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2

The Chip-Level and Package-Level Degradation of Cascode GaN..:

Shi, Yijun ; Wu, Shan ; He, Zhiyuan...
IEEE Journal of the Electron Devices Society.  11 (2023)  - p. 426-431 , 2023
 
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3

Cascode GaN device's Electrical Performance Failure Caused ..:

, In: 2023 24th International Conference on Electronic Packaging Technology (ICEPT),
Shi, Yijun ; Wu, Shan ; He, Zhiyuan... - p. 1-5 , 2023
 
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5

Degradation mechanism analysis for SiC power MOSFETs under ..:

Rao, Yunliang ; Chen, Yuan ; He, Zhiyuan...
Journal of Physics D: Applied Physics.  55 (2021)  9 - p. 095113 , 2021
 
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7

Influence of the Groove Depth on the Electrical Characteris..:

, In: 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS),
Li, Chenglang ; Qiu, Qiuling ; Zhang, Jinwei... - p. 34-39 , 2020
 
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10

Pb(ΙΙ) removal from water using porous hydrogel of chitosan..:

Wang, Wei ; Zhao, Yunliang ; Yi, Hao...
International Journal of Biological Macromolecules.  128 (2019)  - p. 85-93 , 2019
 
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12

Hydrophobic agglomeration behaviors of clay minerals as aff..:

Zhan, Weiquan ; Yi, Hao ; Song, Shaoxian..
Colloids and Surfaces A: Physicochemical and Engineering Aspects.  568 (2019)  - p. 36-42 , 2019
 
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15

Hydrophobic agglomeration of talc fines in aqueous suspensi..:

Yi, Hao ; Zhao, Yunliang ; Rao, Feng.
Colloids and Surfaces A: Physicochemical and Engineering Aspects.  538 (2018)  - p. 327-332 , 2018
 
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