Rayment, T.
119  Ergebnisse:
Personensuche X
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2

A method to detect retained gas during AC electrograining u..:

Hammons, J.A. ; Rayment, T. ; Vandendael, I....
Electrochemistry Communications.  12 (2010)  6 - p. 717-719 , 2010
 
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3

Channel-Flow Cell for X-ray Absorption Spectroelectrochemis..:

Wiltshire, R. J. K. ; Smila-Castro, O. ; Connelly, N. G....
The Journal of Physical Chemistry C.  113 (2008)  1 - p. 308-315 , 2008
 
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4

Modeling the heat flow in spray formed steel shells for too..:

Rayment, T. ; Grant, P. S.
Metallurgical and Materials Transactions B.  37 (2006)  6 - p. 1037-1047 , 2006
 
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5

An X-ray chopper for time-resolved crystallography:

Husheer, S. ; Bowes, K. ; Cole, J....
Acta Crystallographica Section A Foundations of Crystallography.  61 (2005)  a1 - p. c136-c136 , 2005
 
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6

Oxide formation in the Sprayform Tool Process:

Hoile, S. ; Rayment, T. ; Grant, P.S..
Materials Science and Engineering: A.  383 (2004)  1 - p. 50-57 , 2004
 
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7

A particle image velocimetry investigation of in-flight and..:

Newbery, A.P. ; Rayment, T. ; Grant, P.S.
Materials Science and Engineering: A.  383 (2004)  1 - p. 137-145 , 2004
 
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8

The new materials processing beamline at the SRS Daresbury,..:

Cernik, R. J. ; Barnes, P. ; Bushnell-Wye, G....
Journal of Synchrotron Radiation.  11 (2004)  2 - p. 163-170 , 2004
 
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9

Phase transformations and control of residual stresses in t..:

Rayment, T. ; Hoile, S. ; Grant, P. S.
Metallurgical and Materials Transactions B.  35 (2004)  6 - p. 1113-1122 , 2004
 
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10

XSTRIP—a silicon microstrip-based X-ray detector for ultra-..:

Headspith, Jon ; Salvini, G ; Thomas, S.L...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  512 (2003)  1-2 - p. 239-244 , 2003
 
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A new facility for the study of materials processing on the..:

Cernik, R. ; Bushnell-Wye, G. ; Tang, C....
Acta Crystallographica Section A Foundations of Crystallography.  58 (2002)  s1 - p. c67-c67 , 2002
 
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12

Development of a Combined Scanning Ion-Conductance and Near..:

Raval, M. ; Klenerman, D. ; Rayment, T...
Microscopy and Microanalysis.  5 (1999)  S2 - p. 976-977 , 1999
 
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