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Regan, B.C.
3518  Ergebnisse:
Personensuche X
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1

Spectrum Imaging of a Lithium Ion Battery Anode Using Thin ..:

Mecklenburg, Matthew ; Lodico, Jared J ; Chan, Ho Leung...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 672-673 , 2023
Link: https://doi.org/10.1093/..
 
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2

Operando two-terminal devices inside a transmission electro..:

Recalde-Benitez, Oscar ; Jiang, Tianshu ; Winkler, Robert...
Communications Engineering.  2 (2023)  1 - p. , 2023
Link: https://doi.org/10.1038/..
 
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3

Emission-Based Temperature Mapping with STEM EBIC:

Hubbard, William A ; Mecklenburg, Matthew ; Chan, Ho Leung.
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1608-1609 , 2023
Link: https://doi.org/10.1093/..
 
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4

Mapping Conductivity in the TEM with SEEBIC:

Hubbard, William A ; Chan, Ho Leung ; Regan, B C
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1851-1852 , 2023
Link: https://doi.org/10.1093/..
 
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5

A Low-Noise, Two-Channel STEM EBIC Metrology System:

Hubbard, William A ; Mecklenburg, Matthew ; Regan, B C
Microscopy and Microanalysis.  28 (2022)  S1 - p. 794-795 , 2022
Link: https://doi.org/10.1017/..
 
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6

Determining the Polarization Fraction of Thin Film Ferroele..:

Chan, Ho Leung ; Fields, Shelby S ; O'Neill, Tristan...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 2270-2271 , 2022
Link: https://doi.org/10.1017/..
 
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7

Separation of EBIC Modes with Two-Channel STEM EBIC:

Hubbard, William A ; Chan, Ho Leung ; Mecklenburg, Matthew.
Microscopy and Microanalysis.  28 (2022)  S1 - p. 2508-2509 , 2022
Link: https://doi.org/10.1017/..
 
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8

Detecting Temperature-Induced Strain Changes using In Situ ..:

Chen, Yueyun ; Lodico, Jared J ; Ling, Xin Yi..
Microscopy and Microanalysis.  28 (2022)  S1 - p. 576-577 , 2022
Link: https://doi.org/10.1017/..
 
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9

In Situ Transmission Kikuchi Diffraction Observation of Thi..:

Chen, Yueyun ; Chan, Ho Leung ; Regan, B C.
Microscopy and Microanalysis.  28 (2022)  S1 - p. 2314-2315 , 2022
Link: https://doi.org/10.1017/..
 
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10

Nanoscale Conductivity Mapping: Live Imaging of Dielectric ..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Hubbard, William A. ; Lodico, Jared J. ; Chan, Ho Leung.. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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11

In Situ Visualization of the Electron Wind Force in the Ela..:

Mecklenburg, Matthew ; Zutter, Brian ; Hubbard, William A...
Microscopy and Microanalysis.  27 (2021)  S1 - p. 106-107 , 2021
Link: https://doi.org/10.1017/..
 
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12

Modern STEM EBIC: Emerging Modes and Methods:

Hubbard, William ; Mecklenburg, Matthew ; Lodico, Jared...
Microscopy and Microanalysis.  27 (2021)  S1 - p. 2350-2352 , 2021
Link: https://doi.org/10.1017/..
 
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13

In Situ STEM Observations of Elemental Segregation in Phase..:

Chan, Ho Leung ; Mecklenburg, Matthew ; Hubbard, William...
Microscopy and Microanalysis.  27 (2021)  S1 - p. 168-169 , 2021
Link: https://doi.org/10.1017/..
 
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14

Technique and Computational Improvements in 4D STEM and Cro..:

O'Neill, Tristan ; Regan, B. C. ; Mecklenburg, Matthew
Microscopy and Microanalysis.  27 (2021)  S1 - p. 1540-1541 , 2021
Link: https://doi.org/10.1017/..
 
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15

Mean Angular Deviation Minimization To Determine Lattice Pa..:

Ling, Xin Yi ; Lodico, Jared ; Regan, B. C..
Microscopy and Microanalysis.  27 (2021)  S1 - p. 1608-1609 , 2021
Link: https://doi.org/10.1017/..
 
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