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2024 IEEE Latin American Electron Devices Conference (LAEDC) ,
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Characterization and TCAD Simulation of the Electrostatic P..:
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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Understanding the role of encapsulation layers under wet co..:
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Lecture Notes in Electrical Engineering; Proceedings of SIE 2023 ,
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GaN HEMT with p-Type Schottky Gate: A Case Study of TCAD Mo..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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TCAD study of the Holding-Voltage Modulation in Irradiated ..:
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Springer Handbook of Semiconductor Devices; Springer Handbooks ,
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Application of the k ⋅ p Method to Device Simulation:
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Springer Handbook of Semiconductor Devices; Springer Handbooks ,
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