E-LIB Suche - Ergebnisse für: Regnier, L.

1

Range-Controlled Random Walks:

Régnier, L. ; Bénichou, O. ; Krapivsky, P. L.
Physical Review Letters. 130 (2023) 22 - p. , 2023

2

Multifilaments based on partially miscible polymers blend f..:

Regnier, J ; Cloarec, C ; Cayla, A..
IOP Conference Series: Materials Science and Engineering. 1266 (2023) 1 - p. 012020 , 2023

Link: https://doi.org/10.1088/..

3

Hot-carrier reliability and performance study of transistor..:

Devoge, P. ; Aziza, H. ; Lorenzini, P....
Microelectronics Reliability. 138 (2022) - p. 114699 , 2022

Link: https://doi.org/10.1016/..

4

AC stress analysis of trench-based multi-gate transistors i..:

Gay, R. ; Marca, V. Della ; Aziza, H....
Microelectronics Reliability. 138 (2022) - p. 114732 , 2022

Link: https://doi.org/10.1016/..

5

Gate-to-drain/source overlap and asymmetry effects on hot-c..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),

Devoge, P. ; Aziza, H. ; Lorenzini, P.... - p. 1-5 , 2022

Link: https://doi.org/10.1109/..

6

Advanced 200-mm RF SOI Technology exhibiting $78\ \text{fs}..:

, In: 2022 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),

Gianesello, F. ; Fleury, A. ; Julien, F.... - p. 191-194 , 2022

Link: https://doi.org/10.1109/..

7

Male frontal fibrosing alopecia: study of 35 cases and asso..:

Westphal, D.C. ; Caballero‐Uribe, N. ; Regnier, A....
Journal of the European Academy of Dermatology and Venereology. 35 (2021) 9 - p. , 2021

Link: https://doi.org/10.1111/..

8

Hot-carrier evaluation of a zero-cost transistor developed ..:

Devoge, P. ; Aziza, H. ; Lorenzini, P....
Microelectronics Reliability. 126 (2021) - p. 114265 , 2021

Link: https://doi.org/10.1016/..

9

Unbalance Detection and Prediction in Induction Machine Usi..:

, In: Lecture Notes in Mechanical Engineering; Advances in Condition Monitoring and Structural Health Monitoring,

Picot, A. ; Régnier, J. ; Maussion, P. - p. 69-76 , 2021

Link: https://doi.org/10.1007/..

10

Prepubertal pattern hair loss:

Trüeb, R. M. ; Casañas‐Quintana, E. ; Régnier, A..
Clinical and Experimental Dermatology. 47 (2021) 1 - p. 173-175 , 2021

Link: https://doi.org/10.1111/..

11

Gate stress reliability of a novel trench-based Triple Gate..:

Gay, R. ; Marca, V. Della ; Aziza, H....
Microelectronics Reliability. 126 (2021) - p. 114233 , 2021

Link: https://doi.org/10.1016/..

12

Extraordinary claims without extraordinary evidence: contro..:

Trüeb, R.M. ; Régnier, A. ; Caballero‐Uribe, N...
Journal of the European Academy of Dermatology and Venereology. 35 (2021) 8 - p. , 2021

Link: https://doi.org/10.1111/..

13

AC stress reliability study of a new high voltage transisto..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),

Locati, J. ; Della-Marca, V. ; Rivero, C.... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

14

AC stress reliability study on a novel vertical MOS transis..:

Locati, J. ; Della Marca, V. ; Rivero, C....
Microelectronics Reliability. 114 (2020) - p. 113810 , 2020

Link: https://doi.org/10.1016/..

15

Combining borehole log-stratigraphies and ambient vibration..:

Rohmer, O. ; Bertrand, E. ; Mercerat, E.D....
Engineering Geology. 270 (2020) - p. 105588 , 2020

Link: https://doi.org/10.1016/..