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X
Reorda, M. Sonza
~ 300  Ergebnisse:
Personensuche X
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1

Early Detection of Permanent Faults in DNNs Through the App..:

, In: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS),
Turco, V. ; Ruospo, A. ; Sanchez, E.. - p. 13-18 , 2024
Link: https://doi.org/10.1109/..
 
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2

TCC: GPGPU Architecture for Instruction Decoder and Control..:

, In: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS),
K, Raghunandana K ; R, Yogesh Prasad K ; Reorda, M. Sonza. - p. 104-109 , 2024
Link: https://doi.org/10.1109/..
 
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3

Image Test Libraries for the on-line self-test of functiona..:

, In: 2023 IEEE European Test Symposium (ETS),
Ruospo, A. ; Gavarini, G. ; Porsia, A.... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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4

Assessing Convolutional Neural Networks Reliability through..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Ruospo, A. ; Gavarini, G. ; de Sio, C.... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
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5

TREFU: An Online Error Detecting and Correcting Fault Toler..:

, In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS),
K, Raghunandana K ; B.K.S.V.L., Varaprasad ; Reorda, M. Sonza. - p. 1-7 , 2023
Link: https://doi.org/10.1109/..
 
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6

DDSR: An Online GPGPU Instruction Decoder Error Detecting a..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
K K, Raghunandana ; Prasad K R, Yogesh ; Reorda, M. Sonza. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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7

Targeting different defect-oriented fault models in IC test..:

, In: 2023 26th Euromicro Conference on Digital System Design (DSD),
Mirabella, N. ; Floridia, A. ; Cantoro, R... - p. 214-219 , 2023
Link: https://doi.org/10.1109/..
 
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8

Uncovering hidden vulnerabilities in CNNs through evolution..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Turco, V. ; Ruospo, A. ; Gavarini, G... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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9

A novel Pattern Selection Algorithm to reduce the Test Cost..:

, In: 2022 IEEE 23rd Latin American Test Symposium (LATS),
Iaria, G. ; Angione, F. ; Bernardi, P.... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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10

Test, Reliability and Functional Safety Trends for Automoti..:

, In: 2022 IEEE European Test Symposium (ETS),
Angione, F. ; Appello, D. ; Aribido, J.... - p. 1-10 , 2022
Link: https://doi.org/10.1109/..
 
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11

A comparative overview of ATPG flows targeting traditional ..:

, In: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Mirabella, N. ; Floridia, A. ; Cantoro, R... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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12

REFU: Redundant Execution with Idle Functional Units, Fault..:

, In: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI),
K, Raghunandana K ; BKSVL, Varaprasad ; Reorda, M. Sonza. - p. 394-397 , 2022
Link: https://doi.org/10.1109/..
 
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13

In-field Data Collection System through Logic BIST for larg..:

, In: 2022 IEEE International Test Conference (ITC),
Filipponi, G. ; Iaria, G. ; Reorda, M. Sonza... - p. 646-649 , 2022
Link: https://doi.org/10.1109/..
 
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14

An Optimized Burn-In Stress Flow targeting Interconnections..:

, In: 2022 IEEE European Test Symposium (ETS),
Angione, F. ; Bernardi, P. ; Filipponi, G.... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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15

A novel SEU injection setup for Automotive SoC:

, In: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE),
Iaria, G. ; Foscale, T. ; Bernardi, P.... - p. 623-626 , 2022
Link: https://doi.org/10.1109/..
 
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