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Rezzak, Nadia
10  Ergebnisse:
Personensuche X
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1

Single Event Effects Characterization of Microchip Programm..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),
Leuenberger, Marco ; Stevens, Russell ; Rezzak, Nadia. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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2

Mitigation and Recovery of Single Event Effects in RTG4™ Tr..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Villafranca, Alberto Gonzalez ; Florit, Albert Ferrer ; Casas, Marti Farras.. - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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3

TID and SEE characterization of Microchip PolarFire® SoC FP..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Rezzak, Nadia ; Chipana, R. ; Cai, Alex... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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4

In Orbit Programming and SEE characterization of the Microc..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Rezzak, Nadia ; Chipana, R. ; Lao, C.... - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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5

Single Event Effects Characterization of Microchip's Progra..:

, In: 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC),
Leuenberger, Marco ; Sureau, Mathieu ; Stevens, Russell.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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6

Total Ionizing Dose Characterization of 28 nm PolarFire SON..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Rezzak, Nadia ; Wang, Jih-Jong ; Cai, Alex.. - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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7

Proton Characterization of RTG4 Flash-Based FPGA for LEO En..:

, In: 2019 IEEE Radiation Effects Data Workshop,
Rezzak, Nadia ; Wang, Jih-Jong ; Hawley, Frank. - p. 1-5 , 2019
Link: https://doi.org/10.1109/..
 
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8

Heavy Ion SEL/SEE Testing of Microsemi Integrated Motor Con..:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Sureau, Mathieu ; Stevens, Russell ; Leuenberger, Marco.. - p. 1-5 , 2018
Link: https://doi.org/10.1109/..
 
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9

The impact of device width on the variability of post-irrad..:

Rezzak, Nadia ; Maillard, Pierre ; Schrimpf, Ronald D....
Microelectronics Reliability.  52 (2012)  11 - p. 2521-2526 , 2012
Link: https://doi.org/10.1016/..
 
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10

The sensitivity of radiation-induced leakage to STI topolog..:

Rezzak, Nadia ; Alles, Michael L. ; Schrimpf, Ronald D....
Microelectronics Reliability.  51 (2011)  5 - p. 889-894 , 2011
Link: https://doi.org/10.1016/..
 
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