Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Ricq, Stephane
13  Ergebnisse:
Personensuche X
?
1

Analysis methodology of Deep Trench Isolation Field-Effect ..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Tlemsani, Samuel ; Ricq, Stephane ; Marcelot, Olivier. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
?
2

Investigating Reliability of NIR QD-based Photodiodes Under..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Hammad, Ismail ; Coignus, Jean ; Ney, David... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
?
3

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
Sensors.  20 (2020)  1 - p. 287 , 2020
Link: https://doi.org/10.3390/..
 
?
4

A comparative mismatch study of the 20nm Gate-Last and 28nm..:

Rahhal, Lama ; Bajolet, Aurelie ; Manceau, Jean-Philippe...
Solid-State Electronics.  108 (2015)  - p. 53-60 , 2015
Link: https://doi.org/10.1016/..
 
?
5

Study of CdTe and CdZnTe detectors for X-ray computed tomog..:

Ricq, Stéphane ; Glasser, Francis ; Garcin, Michel
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  458 (2001)  1-2 - p. 534-543 , 2001
Link: https://doi.org/10.1016/..
 
?
6

CdTe and CdZnTe detectors behavior in X-ray computed tomogr..:

Ricq, Stéphane ; Glasser, Francis ; Garcin, Michel
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  442 (2000)  1-3 - p. 45-52 , 2000
Link: https://doi.org/10.1016/..
 
?
7

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
https://oatao.univ-toulouse.fr/26913/1/Doyen_26913.pdf.  , 2020
Link: https://oatao.univ-toulo..
 
?
8

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6982946/.  , 2020
Link: http://www.ncbi.nlm.nih...
 
?
9

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20010287.  , 2020
Link: https://hal.archives-ouv..
 
?
10

Electrical Characterization of the Backside Interface on BS..:

Célestin Doyen ; Stéphane Ricq ; Pierre Magnan...
https://www.mdpi.com/1424-8220/20/1/287.  , 2020
Link: https://doi.org/10.3390/..
 
?
11

Electrical Characterization of the Backside Interface on BS..:

Célestin Doyen ; Stéphane Ricq ; Pierre Magnan...
https://dx.doi.org/10.3390/s20010287.  , 2020
Link: https://doi.org/10.3390/..
 
?
12

Intermediates in wet oxidation of cellulose: identification..:

Robert, Raphaël ; Barbati, Stéphane ; Ricq, Natacha.
Water Research.  36 (2002)  19 - p. 4821-4829 , 2002
Link: https://doi.org/10.1016/..
 
?
13

Electrokinetic characterization of polyethersulfone UF memb..:

Ricq, Laurence ; Pierre, André ; Bayle, Stéphane.
Desalination.  109 (1997)  3 - p. 253-261 , 1997
Link: https://doi.org/10.1016/..
 
1-13