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Ridler, Nick
86  Ergebnisse:
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1

Some Recent Advances in Measurements at Millimeter-Wave and..:

Shang, Xiaobang ; Ridler, Nick ; Stokes, Daniel...
IEEE Microwave Magazine.  25 (2024)  1 - p. 58-71 , 2024
Link: https://doi.org/10.1109/..
 
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2

RF and microwave metrology for quantum computing – recent d..:

Stanley, Manoj ; Shang, Xiaobang ; Celep, Murat...
International Journal of Microwave and Wireless Technologies.  , 2024
Link: https://doi.org/10.1017/..
 
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3

Improvements to Millimeter-Wave Dielectric Measurement Usin..:

Shu, Minjie ; Shang, Xiaobang ; Ridler, Nick...
IEEE Transactions on Instrumentation and Measurement.  73 (2024)  - p. 1-8 , 2024
Link: https://doi.org/10.1109/..
 
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4

Comparison of TRL Calibration Standards and Techniques for ..:

, In: 2023 53rd European Microwave Conference (EuMC),
Skinner, James ; Campion, James ; Ridler, Nick - p. 584-587 , 2023
Link: https://doi.org/10.23919..
 
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5

Characterising Scattering Parameters of Coaxial Microwave D..:

, In: 2023 53rd European Microwave Conference (EuMC),
Stanley, Manoj ; Shin, Sang-Hee ; Skinner, James.. - p. 150-153 , 2023
Link: https://doi.org/10.23919..
 
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6

Interlaboratory Investigation of On-wafer S-parameter Measu..:

, In: 2023 53rd European Microwave Conference (EuMC),
Shang, Xiaobang ; Ridler, Nick ; Arz, Uwe... - p. 624-627 , 2023
Link: https://doi.org/10.23919..
 
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7

Characterizing Precision Coaxial Air Lines as Reference Sta..:

, In: 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023,
Skinner, James ; Stanley, Manoj ; Urbonas, Jonas... - p. 561-564 , 2023
Link: https://doi.org/10.1109/..
 
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8

Characterisation of dielectric materials at G-band (140–220..:

, In: 2022 52nd European Microwave Conference (EuMC),
Shu, Minjie ; Shang, Xiaobang ; Ridler, Nick... - p. 107-110 , 2022
Link: https://doi.org/10.23919..
 
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9

Engineering the microwave to infrared noise photon flux for..:

Danilin, Sergey ; Barbosa, João ; Farage, Michael...
EPJ Quantum Technology.  9 (2022)  1 - p. , 2022
Link: https://doi.org/10.1140/..
 
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10

Uncertainty of S-Parameter Measurements on PCBs due to Impe..:

Koo, Hyunji ; Salter, Martin ; Kang, No-Weon..
Journal of Electromagnetic Engineering and Science.  21 (2021)  5 - p. 369-378 , 2021
Link: https://doi.org/10.26866..
 
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11

3-D printed primary standards for calibration of microwave ..:

Jones, Adam ; Lucyszyn, Stepan ; Márquez-Segura, Enrique...
Measurement.  158 (2020)  - p. 107682 , 2020
Link: https://doi.org/10.1016/..
 
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12

A Review of Measurement Capabilities at Millimetre and Subm..:

, In: 2018 11th UK-Europe-China Workshop on Millimeter Waves and Terahertz Technologies (UCMMT),
Shang, Xiaobang ; Ridler, Nick ; Clarke, Roland. - p. 1-3 , 2018
Link: https://doi.org/10.1109/..
 
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13

Guest Editorial:

Ridler, Nick
IET Microwaves, Antennas & Propagation.  11 (2017)  3 - p. 303-303 , 2017
Link: https://doi.org/10.1049/..
 
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14

Evaluating residual errors in waveguide VNAs from microwave..:

Stant, Laurence ; Aaen, Peter ; Ridler, Nick
IET Microwaves, Antennas & Propagation.  11 (2017)  3 - p. 324-329 , 2017
Link: https://doi.org/10.1049/..
 
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15

ARFTG 2017:

Aaen, Peter H. ; Ridler, Nick
IEEE Microwave Magazine.  18 (2017)  3 - p. 98-100 , 2017
Link: https://doi.org/10.1109/..
 
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