E-LIB Suche - Ergebnisse für: Riess, Christian

, In: Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges; Lecture Notes in Computer Science,

Moussa, Denise ; Hirsch, Germans ; Riess, Christian - p. 264-280 , 2023

Link: https://doi.org/10.1007/..

7

Frequency-Domain Analysis of Traces for the Detection of AI..:

, In: 2023 11th International Workshop on Biometrics and Forensics (IWBF),

Bergmann, Sandra ; Moussa, Denise ; Brand, Fabian.. - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

8

On the Security of the One-and-a-Half-Class Classifier for ..:

Lorch, Benedikt ; Schirrmacher, Franziska ; Maier, Anatol.
IEEE Transactions on Information Forensics and Security. 18 (2023) - p. 2466-2479 , 2023

Link: https://doi.org/10.1109/..

9

Benchmarking Probabilistic Deep Learning Methods for Licens..:

Schirrmacher, Franziska ; Lorch, Benedikt ; Maier, Anatol.
IEEE Transactions on Intelligent Transportation Systems. 24 (2023) 9 - p. 9203-9216 , 2023

Link: https://doi.org/10.1109/..

10

Bayesian Convolutional Neural Networks for Limited Data Hyp..:

Joshaghani, Mohammad ; Davari, Amirabbas ; Hatamian, Faezeh Nejati..
IEEE Geoscience and Remote Sensing Letters. 20 (2023) - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

11

LORD: Leveraging Open-Set Recognition with Unknown Data:

, In: 2023 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW),

Koch, Tobias ; Riess, Christian ; Kohler, Thomas - p. 4388-4398 , 2023

Link: https://doi.org/10.1109/..

12

Hyperspectral Image Analysis using Limited Data:

Davari, Amirabbas , 2022

Link: https://nbn-resolving.de..

13

Compliance Challenges in Forensic Image Analysis Under the ..:

, In: 2022 30th European Signal Processing Conference (EUSIPCO),

Lorch, Benedikt ; Scheler, Nicole ; Riess, Christian - p. 613-617 , 2022

Link: https://doi.org/10.23919..

14

Bayesian Tools for Reliable Multimedia Forensics:

, In: 2022 VIII International Conference on Information Technology and Nanotechnology (ITNT),

Maier, Anatol ; Lorch, Benedikt ; Riess, Christian - p. 1-6 , 2022

Link: https://doi.org/10.1109/..

15

Deep Metric Color Embeddings for Splicing Localization in S..:

Hadwiger, Benjamin Christopher ; Riess, Christian
IEEE Transactions on Information Forensics and Security. 17 (2022) - p. 2614-2627 , 2022

Link: https://doi.org/10.1109/..