Romandic, I.
20  Ergebnisse:
Personensuche X
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2

Experimental and theoretical study of the thermal solubilit..:

Vanhellemont, J. ; Lauwaert, J. ; Witecka, A....
Physica B: Condensed Matter.  404 (2009)  23-24 - p. 4529-4532 , 2009
 
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3

Ab-initio simulation of self-interstitial in germanium:

Śpiewak, P. ; Vanhellemont, J. ; Sueoka, K...
Materials Science in Semiconductor Processing.  11 (2008)  5-6 - p. 328-331 , 2008
 
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5

On the characterisation of grown-in defects in Czochralski-..:

Vanhellemont, J. ; Van Steenbergen, J. ; Holsteyns, F....
Journal of Materials Science: Materials in Electronics.  19 (2008)  S1 - p. 24-31 , 2008
 
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6

Carrier lifetime dependence on doping, metal implants and e..:

Gaubas, E. ; Vanhellemont, J. ; Simoen, E....
Physica B: Condensed Matter.  401-402 (2007)  - p. 222-225 , 2007
 
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8

Ab initio calculation of the formation energy of charged va..:

Śpiewak, P. ; Sueoka, K. ; Vanhellemont, J....
Physica B: Condensed Matter.  401-402 (2007)  - p. 205-209 , 2007
 
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9

Simulation of point defect diffusion in germanium:

Lauwaert, J. ; Hens, S. ; Śpiewak, P....
Physica B: Condensed Matter.  376-377 (2006)  - p. 257-261 , 2006
 
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10

Simulation of intrinsic point defect properties and vacancy..:

Śpiewak, P. ; Kurzydłowski, K.J. ; Vanhellemont, J....
Materials Science in Semiconductor Processing.  9 (2006)  4-5 - p. 465-470 , 2006
 
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11

Optical characterization of dislocation free Ge and GeOI wa..:

Kalem, Seref ; Romandic, I. ; Theuwis, A.
Materials Science in Semiconductor Processing.  9 (2006)  4-5 - p. 753-758 , 2006
 
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13

Characterization of bulk microdefects in Ge single crystals:

Poelman, D. ; De Gryse, O. ; De Roo, N....
Journal of Applied Physics.  96 (2004)  11 - p. 6164-6168 , 2004
 
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14

Time-resolved photoluminescence spectroscopy of tunnelling ..:

Romandic, I ; Bouwen, A ; Goovaerts, E..
Semiconductor Science and Technology.  15 (2000)  7 - p. 665-675 , 2000
 
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15

Time dependence of quantum well recombination luminescence ..:

Romandic, I ; Bouwen, A ; Goovaerts, E...
Microelectronic Engineering.  43-44 (1998)  - p. 363-369 , 1998
 
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