Ronchi, Silas N.
109  Ergebnisse:
Personensuche X
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11

Study of Endurance Performance of SiO2 Interfacial Layer Sc..:

Agarwal, A. ; Walke, A. M. ; Ronchi, N...
IEEE Transactions on Electron Devices.  71 (2024)  8 - p. 4619-4625 , 2024
 
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12

Variability in Planar FeFETs—Channel Percolation Impact:

Kaczmarek, K. ; Bardon, M. Garcia ; Xiang, Y....
IEEE Transactions on Electron Devices.  70 (2023)  7 - p. 3928-3934 , 2023
 
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14

Probing the evolution of electrically active defects in dop..:

, In: 2020 IEEE Symposium on VLSI Technology,
Celano, U. ; Chen, Y.-H. ; Minj, A.... - p. 1-2 , 2020
 
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15

Defect profiling in FEFET Si:HfO2 layers:

O'Sullivan, B. J. ; Putcha, V. ; Izmailov, R....
Applied Physics Letters.  117 (2020)  20 - p. , 2020
 
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