Rudolf, Matthias
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The role of gate leakage on surface-related current collaps..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
 
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Interference and Noise:

, In: Fundamentals of RF and Microwave Techniques and Technologies,
Rudolph, Matthias - p. 747-791 , 2023
 
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