Sakamoto, Toshihiro
627  Ergebnisse:
Personensuche X
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2

Introduction of Highly Reliable Versatile Analog Platform w..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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5

Study of Unique ESD Tolerance Dependence on Backgate Ratio ..:

, In: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Komatsu, Kanako ; Ozaki, Koichi ; Takeuchi, Fumio... - p. 315-318 , 2021
 
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Investigating the Highly Tolerant LDMOS Cell Array Design a..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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9

Incorporating environmental variables into a MODIS-based cr..:

Sakamoto, Toshihiro
ISPRS Journal of Photogrammetry and Remote Sensing.  160 (2020)  - p. 208-228 , 2020
 
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11

Investigation of the Breakdown Voltage Degradation under Ho..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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12

Charge/polarity-dependent 2D separation: a new chromatograp..:

Sakamoto, Toshihiro ; Shinohara, Junpei ; Shido, Chiaki...
Japanese Journal of Applied Physics.  58 (2019)  SB - p. SBBG14 , 2019
 
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13

Design Method and Mechanism Study of LDMOS to Conquer Stres..:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Komatsu, Kanako ; Kinoshita, Tomoko ; Shioda, Saori... - p. 363-366 , 2019
 
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15

Semi-automatic classification method for mapping the rice-p..:

Sakamoto, Toshihiro ; Sprague, David S. ; Okamoto, Katsuo.
Remote Sensing Applications: Society and Environment.  10 (2018)  - p. 7-17 , 2018
 
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