Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Samanni, G.
8  Ergebnisse:
Personensuche X
?
1

Unveiling Retention Physical Mechanism of Ge-rich GST ePCM ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Laurin, L. ; Baldo, M. ; Petroni, E.... - p. 1-7 , 2023
Link: https://doi.org/10.1109/..
 
?
2

BEOL Process Effects on ePCM Reliability:

Redaelli, A. ; Gandolfo, A. ; Samanni, G....
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 563-568 , 2022
Link: https://doi.org/10.1109/..
 
?
3

Heater system optimization for robust ePCM reliability and ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ranica, R. ; Berthelon, R. ; Gandolfo, A.... - p. 28.1.1-28.1.4 , 2021
Link: https://doi.org/10.1109/..
 
?
4

Crystallization Speed in Ge-Rich PCM Cells as a Function of..:

Gomiero, E. ; Ristoiu, D. ; Reynard, J. P....
IEEE Journal of the Electron Devices Society.  7 (2019)  - p. 517-521 , 2019
Link: https://doi.org/10.1109/..
 
?
5

DTA traces of epoxy resins and composites: Effect of fibers..:

Schiraldi, A. ; Baldini, P. ; Samanni, G..
Journal of Thermal Analysis.  29 (1984)  4 - p. 645-653 , 1984
Link: https://doi.org/10.1007/..
 
?
6

Quantitative DTA of epoxy adhesives of technological intere..:

Schiraldi, A. ; Wagner, V. ; Samanni, G..
Journal of Thermal Analysis.  21 (1981)  2 - p. 299-307 , 1981
Link: https://doi.org/10.1007/..
 
?
7

BEOL Process Effects on ePCM Reliability:

A. Redaelli ; A. Gandolfo ; G. Samanni...
https://ieeexplore.ieee.org/document/9743565/.  , 2022
Link: https://doi.org/10.1109/..
 
?
8

Crystallization Speed in Ge-Rich PCM Cells as a Function of..:

E. Gomiero ; G. Samanni ; J. Jasse...
https://ieeexplore.ieee.org/document/8704299/.  , 2019
Link: https://doi.org/10.1109/..
 
1-8