Santillan, Julius Joseph
93  Ergebnisse:
Personensuche X
?
3

Effect of Alternative Developer Solutions on EUVL Patternin:

Santillan, Julius Joseph ; Shimizu, Kyoko ; Otogawa, Ryuichi.
Journal of Photopolymer Science and Technology.  35 (2022)  1 - p. 67-74 , 2022
 
?
8

Dependence of relationship between chemical gradient and li..:

Kozawa, Takahiro ; Nakajima, Ayako ; Yamada, Teppei...
Japanese Journal of Applied Physics.  58 (2019)  3 - p. 036501 , 2019
 
?
9

Alternative Developer Solutions and Processes for EUV and A..:

Harumoto, Masahiko ; Santillan, Julius Joseph ; Nakayama, Chisayo...
Journal of Photopolymer Science and Technology.  32 (2019)  2 - p. 321-326 , 2019
 
?
10

Pulse radiolysis of methacrylic acid ligand for zirconia na..:

Yamada, Teppei ; Ishihara, Satoshi ; Muroya, Yusa...
Japanese Journal of Applied Physics.  58 (2019)  3 - p. 036503 , 2019
 
?
11

Relationship between Resolution Blur and Stochastic Defect ..:

Kozawa, Takahiro ; Santillan, Julius Joseph ; Itani, Toshiro
Journal of Photopolymer Science and Technology.  32 (2019)  1 - p. 161-167 , 2019
 
?
12

Resist Patterning Characteristics using KrF Laser-ablation ..:

Yamaoka, Hiroshi ; Santillan, Julius Joseph ; Uemori, Nobutaka.
Journal of Photopolymer Science and Technology.  32 (2019)  2 - p. 355-360 , 2019
 
?
13

Characterization Studies on Metal-based EUV Resist Film Pro..:

Santillan, Julius Joseph ; Itani, Toshiro
Journal of Photopolymer Science and Technology.  31 (2018)  5 - p. 663-667 , 2018
 
?
15

Relationship between Resolution Blur and Shot Noise in Line..:

Kozawa, Takahiro ; Santillan, Julius Joseph ; Itani, Toshiro
Journal of Photopolymer Science and Technology.  31 (2018)  2 - p. 183-188 , 2018
 
1-15