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2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) ,
3
Comparing Rectangular and ELT MOSFET layouts under TID:
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2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
7
Ionizing Radiation Hardness Characterization of GaN HEMTs D..:
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2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
8
Heavy-Ion-Induced Avalanche Multiplication in Low-Voltage P..:
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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
10
Radiation Hardness of GaN HEMTs to TID Effects: COTS for ha..:
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2019 34th Symposium on Microelectronics Technology and Devices (SBMicro) ,
11