Saraf, Iqbal
22  Ergebnisse:
Personensuche X
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5

Impact of Phase-Change Memory Drift on Energy Efficiency an..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Frank, Martin M. ; Li, Ning ; Rasch, Malte J.... - p. 1-10 , 2023
 
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6

Functional Testing of AI Cores through Thinned 3D I/O Buffe..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Farooq, Mukta ; Kumar, Arvind ; Lee, Sae-Kyu... - p. 977-980 , 2022
 
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7

Electrically Testable Product Macro Multi-via Measurement f..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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9

Stacked Silicon Microcoolers:

, In: 2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm),
 
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10

Effect of In-situ Capping on Phase Change Memory Device Per..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Brew, Kevin W. ; Conti, Richard ; Saraf, Iqbal... - p. 1-5 , 2020
 
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13

Demonstration of transfer learning using 14 nm technology a..:

Fabia Farlin Athena ; Omobayode Fagbohungbe ; Nanbo Gong...
https://www.frontiersin.org/articles/10.3389/felec.2023.1331280/full.  , 2024
 
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