Sasso G
693  Ergebnisse:
Personensuche X
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1

OC-0610 Long-term outcomes of TROG13.01 SAFRON II: Single v..:

Siva, S. ; Sakyanun, P. ; Mai, T....
Radiotherapy and Oncology.  182 (2023)  - p. S494-S495 , 2023
 
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2

Fluid mixer with two degrees of freedom enabled by dielectr..:

, In: Constitutive Models for Rubber XII,
Sasso, G. ; Carpi, F. ; Pugno, N.. - p. 504-507 , 2022
 
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3

OC-0335 Final results of TROG 13.01 SAFRON II: Single vs mu..:

Siva, S. ; Bressel, M. ; Mai, T....
Radiotherapy and Oncology.  161 (2021)  - p. S247-S249 , 2021
 
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4

Stereotactic Ablative Fractionated Radiotherapy versus Radi..:

Siva, S. ; Bressel, M. ; Kron, T....
International Journal of Radiation Oncology*Biology*Physics.  108 (2020)  3 - p. S3-S4 , 2020
 
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5

EP-2070 Comparison of multi-atlas based synthetic CT genera..:

Choi, C. ; Sasso, G. ; Pontre, B.
Radiotherapy and Oncology.  133 (2019)  - p. S1141-S1142 , 2019
 
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7

Humidification Mitigates Mucosal Toxicity During Head and N..:

Macann, A.M.J. ; Paizi, W.F. ; Simpson, J....
International Journal of Radiation Oncology*Biology*Physics.  96 (2016)  2 - p. E327-E328 , 2016
 
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8

Three-Dimensional Chemical Spectroscopic Imaging Predicts I..:

Her, E.J. ; Kazi, A. ; Simpson, J..
International Journal of Radiation Oncology*Biology*Physics.  96 (2016)  2 - p. E268 , 2016
 
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9

Reliability of high-speed SiGe:C HBT under electrical stres..:

Jacquet, T. ; Sasso, G. ; Chakravorty, A....
Microelectronics Reliability.  55 (2015)  9-10 - p. 1433-1437 , 2015
 
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10

Ageing and thermal recovery of advanced SiGe heterojunction..:

Fischer, G.G. ; Sasso, G.
Microelectronics Reliability.  55 (2015)  3-4 - p. 498-507 , 2015
 
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11

Scaling influence on the thermal behavior of toward-THz SiG..:

d'Alessandro, V ; Sasso, G ; Rinaldi, N.
Journal of Physics: Conference Series.  494 (2014)  - p. 012002 , 2014
 
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12

USO DE ÍNDICES DE QUALIDADE PARA AVALIAÇÃO DA ÁGUA EM AMBIE..:

Goveia, D. ; Rebelo, A. ; Loro, A. P....
Revista Brasileira de Engenharia de Biossistemas.  8 (2014)  2 - p. 104-111 , 2014
 
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15

Avalanche multiplication and pinch-in models for simulating..:

Sasso, G. ; Costagliola, M. ; Rinaldi, N.
Microelectronics Reliability.  50 (2010)  9-11 - p. 1577-1580 , 2010
 
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