Sawamoto, Naomi
44  Ergebnisse:
Personensuche X
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1

Analysis of InGaAs/InP p-I-n Photodiode Failed by Electrost..:

Ito, Yuta ; Yokogawa, Ryo ; Ueda, Osamu...
Journal of Electronic Materials.  52 (2023)  8 - p. 5150-5158 , 2023
 
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4

The Electronic and Physical Structure Evaluation of MoS2(1−..:

Hibino, Yusuke ; Yamazaki, Kota ; Hashimoto, Yusuke...
ECS Journal of Solid State Science and Technology.  9 (2020)  9 - p. 093018 , 2020
 
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5

Thermal conductivity characteristics in polycrystalline sil..:

Takeuchi, Haruki ; Yokogawa, Ryo ; Takahashi, Kazuya...
Japanese Journal of Applied Physics.  59 (2020)  7 - p. 075501 , 2020
 
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7

Superior subthreshold characteristics of gate-all-around p-..:

Ahn, Min-Ju ; Saraya, Takuya ; Kobayashi, Masaharu...
Japanese Journal of Applied Physics.  59 (2020)  7 - p. 070908 , 2020
 
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10

Width dependence of drain current and carrier mobility in g..:

Jang, Ki-Hyun ; Saraya, Takuya ; Kobayashi, Masaharu...
Japanese Journal of Applied Physics.  59 (2020)  2 - p. 021004 , 2020
 
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11

Stress evaluation induced by wiggling silicon nitride fine ..:

Koharada, Masato ; Yokogawa, Ryo ; Sawamoto, Naomi..
Japanese Journal of Applied Physics.  59 (2020)  SI - p. SIIF03 , 2020
 
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13

Synthesis of $\mathbf{MoS}_{\mathbf{2}(\mathbf{1}-\mathbf{x..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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