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Scardera, Giuseppe
36  Ergebnisse:
Personensuche X
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1

Quantifying the Effect of Nanofeature Size on the Electrica..:

Wang, Shaozhou ; Scardera, Giuseppe ; Ma, Fa-Jun...
IEEE Journal of Photovoltaics.  12 (2022)  3 - p. 744-753 , 2022
Link: https://doi.org/10.1109/..
 
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2

Plasma Focused Ion Beam Tomography for Accurate Characteriz..:

Zhang, Yu ; Veeken, Tom ; Wang, Shaozhou...
Advanced Materials Technologies.  7 (2022)  10 - p. , 2022
Link: https://doi.org/10.1002/..
 
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3

Large volume tomography using plasma FIB-SEM: A comprehensi..:

Zhang, Yu ; Kong, Charlie ; Scardera, Giuseppe...
Ultramicroscopy.  233 (2022)  - p. 113458 , 2022
Link: https://doi.org/10.1016/..
 
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4

An Artificial-Intelligence-Assisted Investigation on the Po..:

Wang, Shaozhou ; Xie, Tong ; Liang, Ran...
ACS Applied Nano Materials.  5 (2022)  8 - p. 11636-11647 , 2022
Link: https://doi.org/10.1021/..
 
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5

Determining the optical properties of solar cells using low..:

Juhl, Mattias Klaus ; Veettil, Binesh Puthen ; Scardera, Giuseppe.
Scientific Reports.  12 (2022)  1 - p. , 2022
Link: https://doi.org/10.1038/..
 
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6

A solid strategy to realize heteroface selective emitter an..:

Zou, Shuai ; Ye, Xiaoya ; Ding, Jianming...
Progress in Photovoltaics: Research and Applications.  30 (2022)  11 - p. 1343-1353 , 2022
Link: https://doi.org/10.1002/..
 
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7

Scanning Electron Microscopy Dopant Contrast Imaging of Pho..:

Zhang, Yu ; Scardera, Giuseppe ; Wang, Shaozhou...
Advanced Materials Technologies.  8 (2022)  1 - p. , 2022
Link: https://doi.org/10.1002/..
 
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8

On the Enhanced Phosphorus Doping of Nanotextured Black Sil..:

Scardera, Giuseppe ; Wang, Shaozhou ; Zhang, Yu...
IEEE Journal of Photovoltaics.  11 (2021)  2 - p. 298-305 , 2021
Link: https://doi.org/10.1109/..
 
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9

Silicon Nanotexture Surface Area Mapping Using Ultraviolet ..:

Scardera, Giuseppe ; Payne, David ; Khan, Muhammad...
IEEE Journal of Photovoltaics.  11 (2021)  5 - p. 1291-1298 , 2021
Link: https://doi.org/10.1109/..
 
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10

Understanding Field-Effect Passivation of Black Silicon: Mo..:

, In: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
Wang, Shaozhou ; Wu, Xinyuan ; Ma, Fajun... - p. 0590-0594 , 2020
Link: https://doi.org/10.1109/..
 
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11

3D characterisation using plasma FIB-SEM: A large-area tomo..:

Zhang, Yu ; Kong, Charlie ; Davidsen, Rasmus Schmidt...
Ultramicroscopy.  218 (2020)  - p. 113084 , 2020
Link: https://doi.org/10.1016/..
 
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12

Improved emitter performance of RIE black silicon through t..:

Fung, Tsun Hang ; Pasanen, Toni P. ; Zhang, Yu...
Solar Energy Materials and Solar Cells.  210 (2020)  - p. 110480 , 2020
Link: https://doi.org/10.1016/..
 
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13

Advanced Characterisation of Black Silicon Surface Topograp..:

, In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC),
Zhang, Yu ; Payne, David N. R. ; Kong, Charlie... - p. 0825-0828 , 2019
Link: https://doi.org/10.1109/..
 
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14

Annual energy yield analysis of solar cell technology:

, In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC),
Abbott, Malcolm ; Xing, Guoqiang ; Scardera, Giuseppe... - p. 3046-3050 , 2019
Link: https://doi.org/10.1109/..
 
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15

Manufacturing metrology for c-Si photovoltaic module reliab..:

Seigneur, Hubert ; Mohajeri, Nahid ; Brooker, R. Paul...
Renewable and Sustainable Energy Reviews.  59 (2016)  - p. 84-106 , 2016
Link: https://doi.org/10.1016/..
 
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