E-LIB Suche - Ergebnisse für: Scheithauer, U.

1

Functionalized ceramic components that enable data acquisit..:

Willemsen, H. ; Scheithauer, U. ; Rebenklau, L.
Chemie Ingenieur Technik. 94 (2022) 9 - p. 1314-1315 , 2022

Link: https://doi.org/10.1002/..

2

Advanced Manufacturing for Advanced Ceramics:

Michaelis, A. ; Scheithauer, U. ; Moritz, T....
Procedia CIRP. 95 (2020) - p. 18-22 , 2020

Link: https://doi.org/10.1016/..

3

Lithography-based ceramic manufacturing (LCM) – Viscosity a..:

Schwarzer, E. ; Götz, M. ; Markova, D....
Journal of the European Ceramic Society. 37 (2017) 16 - p. 5329-5338 , 2017

Link: https://doi.org/10.1016/..

4

Herstellung von funktionellen, hybriden keramik-basierten K..:

, In: Rapid.Tech – International Trade Show & Conference for Additive Manufacturing,

Scheithauer, U. ; Schwarzer, E. ; Günther, P.... - p. 472-487 , 2017

Link: https://doi.org/10.3139/..

5

Herstellung von funktionellen, hybriden keramik-basierten K..:

, In: Rapid.Tech – International Trade Show & Conference for Additive Manufacturing,

Scheithauer, U. ; Schwarzer, E. ; Günther, P.... - p. 473-487 , 2017

Link: https://doi.org/10.1007/..

6

Innovative and novel manufacturing methods of ceramics and ..:

Ahlhelm, M. ; Günther, P. ; Scheithauer, U....
Journal of the European Ceramic Society. 36 (2016) 12 - p. 2883-2888 , 2016

Link: https://doi.org/10.1016/..

7

Characterization of the primary X-ray source of an XPS micr..:

Scheithauer, U.
Journal of Electron Spectroscopy and Related Phenomena. 193 (2014) - p. 58-62 , 2014

Link: https://doi.org/10.1016/..

8

Quantitative lateral resolution of a Quantum 2000 X‐ray mic..:

Scheithauer, U.
Surface and Interface Analysis. 40 (2008) 3-4 - p. 706-709 , 2008

Link: https://doi.org/10.1002/..

9

Combined AES and TOF-SIMS analysis of a thermally treated A..:

Scheithauer, U. ; Treichler, R.
Surface and Interface Analysis. 38 (2006) 4 - p. 296-299 , 2006

Link: https://doi.org/10.1002/..

10

Improved sputter depth resolution in Auger composition‐dept..:

Scheithauer, U.
Surface and Interface Analysis. 39 (2006) 1 - p. 39-44 , 2006

Link: https://doi.org/10.1002/..

11

Examples for the improvements in AES depth profiling of mul..:

Scheithauer, U.
Fresenius' Journal of Analytical Chemistry. 353 (1995) 3-4 - p. 464-467 , 1995

Link: https://doi.org/10.1007/..

12

Evaluation of AES depth profiles of thin‐film systems by ap..:

Scheithauer, U. ; Hösler, W. ; Riedl, G.
Surface and Interface Analysis. 20 (1993) 6 - p. 519-523 , 1993

Link: https://doi.org/10.1002/..

13

Combined AES/factor analysis and RBS investigation of a the..:

Scheithauer, U. ; H�sler, W. ; Bruchhaus, R.
Fresenius' Journal of Analytical Chemistry. 346 (1993) 1-3 - p. 305-307 , 1993

Link: https://doi.org/10.1007/..

14

Dynamics of nitrogen after deeper tillage in arable loess s..:

Nieder, R. ; Scheithauer, U. ; Richter, J.
Biology and Fertility of Soils. 16 (1993) 1 - p. 45-51 , 1993

Link: https://doi.org/10.1007/..

15

Application of the analytical methods REM/EDX, AES and SNMS..:

Scheithauer, U.
Fresenius' Journal of Analytical Chemistry. 341 (1991) 5-6 - p. 445-448 , 1991

Link: https://doi.org/10.1007/..