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2022 IEEE International Integrated Reliability Workshop (IIRW) ,
3
Impact of Single Defects on NBTI and PBTI Recovery in SiO2 ..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
6
Evidence of Tunneling Driven Random Telegraph Noise in Cryo..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
7
Similarities and Differences of BTI in SiC and Si Power MOS..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
8