Schmucker, Scott W
114  Ergebnisse:
Personensuche X
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3

Accelerated Lifetime Testing and Analysis of Delta-Doped Si..:

Halsey, Connor ; Depoy, Jessica ; Campbell, DeAnna M....
IEEE Transactions on Device and Materials Reliability.  22 (2022)  2 - p. 169-174 , 2022
 
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4

A Model for Atomic Precision p-Type Doping with Diborane on..:

Campbell, Quinn ; Ivie, Jeffrey A. ; Bussmann, Ezra...
The Journal of Physical Chemistry C.  125 (2021)  1 - p. 481-488 , 2021
 
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6

Quantum Transport in Si:P δ-Layer Wires:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Mendez, Juan P. ; Mamaluy, Denis ; Gao, Xujiao... - p. 181-184 , 2020
 
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7

Modeling Assisted Room Temperature Operation of Atomic Prec..:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Gao, Xujiao ; Tracy, Lisa A. ; Anderson, Evan M.... - p. 277-280 , 2020
 
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13

Removal of sodium dodecyl sulfate surfactant from aqueous d..:

Rossi, Jamie E. ; Soule, Karen J. ; Cleveland, Erin...
Journal of Colloid and Interface Science.  495 (2017)  - p. 140-148 , 2017
 
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