Seelam, Uma Maheswara Rao
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Structural Characterization of Sputter-Deposited 304 Stainl..:

Seelam, Uma Maheswara Rao ; Suryanarayana, C. ; Heinrich, Helge...
Metallurgical and Materials Transactions A.  43 (2012)  8 - p. 2945-2954 , 2012
 
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Enhanced Physical Layer Security for RIS aided Wireless Net..:

, In: 2023 2nd International Conference on Paradigm Shifts in Communications Embedded Systems, Machine Learning and Signal Processing (PCEMS),
 
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